Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

 

D750Ex

Next Generation, High Density LCD Driver Test System

The D750Ex was designed for testing next generation high-definition LCD driver devices. Based on the very successful J750 platform which is approaching 2700 systems installed worldwide, this new system provides a true high density resource per pin architecture that supports over 97% parallel test efficiency.

The D750Ex also features:

  • Lowest Cost of Test - True per pin test architecture
    provides faster throughput
  • "Zero footprint" tester-in-a-test-head design -
    requires 50-85% less floor space than competitive
    systems
  • Flexible Multi-Site Development Environment -
    ‘Any Pin’ architecture for all channels, dramatically
    simplifies probe card design

 

 

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