Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications. |
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D750Ex System Configurations D750Ex can be configured with up to:
A Memory Test Option (MTO) is also available with the D750Ex, requiring no additional slots and can be leveraged to test mobile driver devices in a single pass. High Instrument Density & Universal Slot Architecture allows for clean Probe Interface Board (PIB) and Probe Card with little circuitry on board for higher reliability and lower maintenance. D750Ex Production Interface is fully compatible with all industry available COF handlers and wafer probers.
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Test Products
