Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

IG-XL Software

 

The D750Ex programming user interface is IG-XL™ Pure Parallel Software, a PC Based/Windows Platform with Built-in multi-site programming support. With IG-XL, D750Ex users will release programs to market faster, empowered with the ability to develop programs seamlessly in a flexible programming environment that implements standard and custom tests rapidly.
 
IG-XL software is designed for rapid program development that automatically scales
to multi-site test, speeding time to market and saving development time and cost.
The software incorporates an easy-to-use workbook environment with a structured programming process that separates Test Methods from Test Data, simplifying data
input and test portability and reuse for faster program development time.
 

IG-XL lets test engineers focus on testing the device versus operating the tester. The
highly responsive software environment streamlines development and debugging, providing instantaneous code changes and full access to all test hardware. Programs
can be scaled quickly for multi-site. Using IG-XL’s powerful site-aware variables, a test program can be written for single site and by simply changing the number of sites and mapping of tester resources in the channel map, the same program can be used for
any number of sites.
 

IG-XL software provides a component-based environment and allows the integration
of third party software tools.
 
IG-XL Software

D750Ex IG-XL Gray Scale Tool

 

 

IG-XL License Express

 
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