Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J750Ex

System Configurations

Teradyne packs power and performance into the compact, economical J750 Family of semiconductor test systems. The J750 Family delivers high-efficiency parallel test in a small “tester in a test head” system footprint. Configurations are less than $1000 per pin, with a basic system – the J750k – starting at $99,000.

All J750 Family systems are DIB compatible across the family. All J750 systems use IG-XL software, and test programs for the J750 and J750k can be quickly migrated to the J750Ex, with translation taking less than an hour for most programs. And J750 systems are upgradeable – from the J750k to the J750 to the J750Ex.

 

J750 Family Configurations

 

J750EX

I/O Channels

Up to 512  or 1024

Data Rate

Up to 200 MHz / 400 Mbps

High Voltage Drivers

1 per 4 digital channels

Parallel Test Site Count (max)

Greater than x256

Vector Memory Depth

Up to 64M per pin with integrated SCAN

Device Power Supplies

Up to 96 power supplies

Scan Depth

Up to 196 Gbit

Software

IG-XL Software

OPTIONS:

DPS Device power supply

 

HDVIS High density VI source

 

MSO Mixed signal option

 

MTO Memory test option

 

CTO Converter test option

 

APMU Analog Pin Measurement Unit

 

DSSC Digital signal source & capture
behind each pin

 

DSHRAM Deep Scan History RAM

J750

I/O Channels

Up to 512  or 1024

Data Rate

Up to 100 MHz

High Voltage Drivers

1 per 16 digital channels

Parallel Test Site Count (max)

Greater than x256

Vector Memory Depth

Up to 16M per pin with integrated SCAN

Device Power Supplies

Up to 32 power supplies

Scan Depth

Up to 49 Gbit

Software

IG-XL Software

OPTIONS:

DPS Device power supply

  HDVIS High density VI source

 

MSO Mixed signal option

 

MTO Memory test option

 

CTO Converter test option

 

APMU Analog Pin Measurement Unit

 

RFID Radio frequency ID test option

J750K

I/O Channels

Up to 256

Data Rate

Up to 50 MHz

High Voltage Drivers

1 per 16 digital channels

Parallel Test Site Count (max)

Up to x16

Vector Memory Depth

Up to 4M per pin with integrated SCAN

Device Power Supplies

Up to 16 power supplies

Scan Depth

Up to 12 Gbit

Software

IG-XL Software built on Windows and
Microsoft Excel

OPTIONS:

DPS Device power supply

  HDVIS High density VI source

 

MSO Mixed signal option

 

MTO Memory test option

 

CTO Converter test option

 

APMU Analog Pin Measurement Unit

 

RFID Radio frequency ID test option

 

 

System Options >