System Configurations
Teradyne packs power and performance into the compact, economical J750 Family of semiconductor test systems. The J750 Family delivers high-efficiency parallel test in a small “tester in a test head” system footprint. Configurations are less than $1000 per pin, with a basic system – the J750k – starting at $99,000.
All J750 Family systems are DIB compatible across the family. All J750 systems use IG-XL software, and test programs for the J750 and J750k can be quickly migrated to the J750Ex, with translation taking less than an hour for most programs. And J750 systems are upgradeable – from the J750k to the J750 to the J750Ex.
| J750 Family Configurations |
 |
J750EX
I/O Channels |
Up to 512 or 1024 |
Data Rate |
Up to 200 MHz / 400 Mbps |
High Voltage Drivers |
1 per 4 digital channels |
Parallel Test Site Count (max) |
Greater than x256 |
Vector Memory Depth |
Up to 64M per pin with integrated SCAN |
Device Power Supplies |
Up to 96 power supplies |
Scan Depth |
Up to 196 Gbit |
Software |
IG-XL Software |
OPTIONS: |
DPS Device power supply |
|
HDVIS High density VI source |
|
MSO Mixed signal option |
|
MTO Memory test option |
|
CTO Converter test option |
|
APMU Analog Pin Measurement Unit |
|
DSSC Digital signal source & capture
behind each pin |
|
DSHRAM Deep Scan History RAM |
|
 |
J750
I/O Channels |
Up to 512 or 1024 |
Data Rate |
Up to 100 MHz |
High Voltage Drivers |
1 per 16 digital channels |
Parallel Test Site Count (max) |
Greater than x256 |
Vector Memory Depth |
Up to 16M per pin with integrated SCAN |
Device Power Supplies |
Up to 32 power supplies |
Scan Depth |
Up to 49 Gbit |
Software |
IG-XL Software |
OPTIONS: |
DPS Device power supply |
| |
HDVIS High density VI source |
|
MSO Mixed signal option |
|
MTO Memory test option |
|
CTO Converter test option |
|
APMU Analog Pin Measurement Unit |
|
RFID Radio frequency ID test option |
|
 |
J750K
I/O Channels |
Up to 256 |
Data Rate |
Up to 50 MHz |
High Voltage Drivers |
1 per 16 digital channels |
Parallel Test Site Count (max) |
Up to x16 |
Vector Memory Depth |
Up to 4M per pin with integrated SCAN |
Device Power Supplies |
Up to 16 power supplies |
Scan Depth |
Up to 12 Gbit |
Software |
IG-XL Software built on Windows and
Microsoft Excel |
OPTIONS: |
DPS Device power supply |
| |
HDVIS High density VI source
|
|
MSO Mixed signal option |
|
MTO Memory test option |
|
CTO Converter test option |
|
APMU Analog Pin Measurement Unit |
|
RFID Radio frequency ID test option |
|
System Options >