Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J750Ex

System Options


A set of Instrument Options allows you to tailor your J750 Family system to your exact device test needs:

•DPS (Device Power Supply) for precision controlled device power

•HDVIS (High Density VI Source) for higher site count and pattern control

•MSO (Mixed Signal Option) for embedded analog, audio, and mixed signal test

•MTO (Memory Test Option) for embedded memory test

•CTO (Converter Test Option) for testing embedded converters

•APMU (Analog Pin Measurement Unit) for mixed signal test

•DSSC (Digital Signal Source & Capture) behind each pin for memory, mixed   signal, and DFT

•DSHRAM (Deep Scan History RAM)

•HVD (High Voltage Digital)

•RFID for testing embedded ID interfaces