Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J750Ex

IG-XL Software

IG-XL™ test software is designed for rapid program development that automatically scales to multisite test, speeding time to market and saving development time and cost. The software incorporates an easy-to-use
  

workbook environment with a structured programming process that separates Test Methods from Test Data, simplifying data input and test portability and reuse for faster program development time.

IG-XL lets test engineers focus on testing the device versus operating the tester. The highly responsive software environment streamlines development and debugging, providing instantaneous code changes and full access to all test hardware. Programs can be scaled quickly for multisite. Using IG-XL’s powerful site-aware variables, a test program can be written for single site and by simply changing the number of sites and mapping of tester resources in the channel map, the same program can be used for any number of sites.

IG-XL software provides a component-based environment and allows the integration of third party software tools.

 
 

 

 

IG-XL License Express >