Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J750

System Options: Converter Test Option

The J750 Converter Test Option (CTO) contains 8 high accuracy source and 8 high accuracy capture channels on one board. Each pair of source and capture channels has the following features:

  • Source with 0 to 6 volts and 0 to 3 volt ranges
  • Acquire input with 0 to 6 volts and 0 to 3 volt ranges
  • Two programmable voltage references
  • 14 bit accuracy with 16 bit resolution
  • Two Parametric Measurement Units (PPMU) for testing the source, capture and reference pins
  • Device Ground Sense (DGS)

The CTO contains 8 source/capture pairs of analog channels controlled by a digital interface that includes a pattern generator with Large Vector Memory (LVM) and a custom ASIC. Source and capture waveforms are stored in two 64k Data Buffer Memories.