System Options: Mixed-Signal Option
Lowest Cost Test Solution for Mixed-Signal Devices
The J750 with Mixed Signal Option (MSO) provides a new approach to testing microcontroller mixed-signal devices at up to 32 sites in parallel, using an efficient, graphical programming interface.
The J750 Mixed Signal Option consists of a Low-to-Mid Frequency (LMF) Analog Signal I/O Module (ASIO) and a companion Digital Signal I/O Module (DSIO). Both provide multiple device test channels on each module, with up to 32 instruments or sites supported in the J750 test system.
Each ASIO provides the following functions:
Digital I/O Module
Each DSIO module aligns with a digital channel board. So, the J750 can be configured with as many DSIOs as there are digital channel boards in the system. Each DSIO module provides two digital source and two digital capture channels with the following modes of operation:
25 MHz Mode
50 MHz Mode
High-Level Test Programming Environment
Test Elements and Test Procedures represent a new test creation model, utilizing a graphical language for specifying tests at a level between the code-based model and the template-based model. Test Elements and Test Procedures provide the flexibility and power required to implement and optimize tests for mixed signal devices. Due to its graphical nature and convenience features, the Test Procedure test creation model is easy to learn and use, allowing test engineers to become more productive more quickly.