Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

J750

System Options : RFID

The RFID Option is ideal for testing RFID interfaces integrated into VLSI devices like Smartcards and I.D. tag applications. These devices are commonly found in banking, telephone, health insurance cards, and luggage tags, as well as a variety of other applications. Teradyne provides a complete, economical test solution with no additional hardware interfaces needed to test these types of devices more accurately and efficiently.

The J750 RFID Option provides 16 bi-directional RFID channels including transmitter and receiver path with synchronization and DSP units. A single RFID board can support parallel test up to 16 sites; two can support up to 32 sites.

  • The J750 RFID option provides 16 bi-directional RFID channels including transmitter and receiver path with synchronization and DSP units. This means there are two RFID options in one J750 system to support parallel test up to 32 sites.
  • The RFID Option can synchronize the response of up to 16 or 32 devices
  • RFID channels are fully synchronized with the pattern generator of the base J750
  • The pattern memory of the RFID Option supports the full functional test of embedded microcontroller or logic devices. This is performed exclusively using the 2 pins of the RFID interface
  • Fast modification of the pattern memory supports device personalization

RFID Board