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Search   All of Teradyne atd atd-ict atd-axi atd-factory atd-functional atd-milaero atd-testdesign Adv Search | Sitemap you are here : Home > News & Events Press Releases 01/10/2012 - UBM Electronics Announces the Finalists for the Test & Measurement World Best in Test Awards 02/22/2012 - Teradyne Presents Evolving In-Circuit Technologies at IPC APEX EXPO 2012 03/07/2012 - Teradyne Revamps Support Network Program, Introduces TSN Select Membership Level 04/19/2012 - Teradyne to Demonstrate Cost Effective Functional Test at NEPCON China 2012 05/11/2012 - Teradyne and Corelis Announce Agreement to Bolster Boundary-Scan In-Circuit Test Capability 12/05/2012 - UBM Tech’s Test & Measurement World Announces the Best in Test Finalists   Upcoming Events Location Date IPC APEX EXPO San Diego Convention Center, San Diego, CA February 19–21, 2013 Stay updated on Teradyne's latest news and upcoming events! Past Events Location Date ITC Test Week Disneyland Hotel, Anaheim, CA November 4-9, 2012 SMTA International Conference Walt Disney World Dolphin, Orlando, Florida October 14-16, 2012 NEPCON Shanghai Booth: 1G90 a Shanghai, China April 25-27, 2012 Goepel UK "TechDays" Presentation: Teradyne's John Walley Imperial War Museum in Duxford, Cambridge, UK March 8, 2012 IPC APEX Expo Test I: In Circuit Test "Integrated Electrical Test within the Production Line," author Michael Smith. Presented by Alan Albee Design for Test (DFT) Presentation: "Virtual Access Technique Augments Test Coverage on Limited Access PCB Assemblies" Anthony Suto San Diego, California February 28-March 1, 2012 Contact Us Request Information Resource Center eKnowledge Login Training at Teradyne

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