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Dates, Locations, Times
June 11: 10am - 5pm
June 12: 10am - 4pm
Bayside Expo Center
Boston MA USA
Visit us at Booth #2934
Equipment:
Papers to be presented:
• Functional Test -
Build, Buy, or Outsource --Bob Stasonis, Product
Mgr. (Tuesday June 11th, 8am-10am)
The Electronics industry is racing towards a world where
probing components for diagnostics will be a thing of
the past. NEMI (National Electronics Manufacturing Initiative)
predicts the demise of test pads within 5 years. While
this gloom and doom may not fully come to fruition in
that time frame, it is clear that functional test is
again a critical part of any manufacturing strategy....
• Testing Limited
Access Boards --Gordon LaPorte, Product Mgr.
(Tuesday June 11th, 10am-12 noon)
Due to advances in manufacturing techniques and new
device designs, as well as the demand for more powerful
and smaller products for the electronic market place,
PCB nodal access is being pushed to the limit - even
to the point of disappearing....
• PXI 101 --Bob
Stasonis, Product Mgr. (Wednesday June 12th, 9am-Noon)
PXI is an exciting new instrumentation standard that
is becoming rapidly accepted for functional test and
data acquisition. In 2001 alone, almost 300 new products
were introduced by over 50 members of the PXI Systems
Alliance (PXISA)....
• Military Testing
Issues --Andy Hutchinson, Teradyne Mil/Aero (Wednesday
June 12, 1pm - 3pm)
Chairperson: Michael E. Keller, Sr., ASTE Executive
Director and Senior Staff Engineer - Dynamics Research
Corp. Andover, MA
Today's Military programs are heavily weighed in terms
of Electronic and Software content. Testing, whether
it is done at the prime contractor, depot, or in the
field, requires specialized test techniques and equipment.
Using COTS (Commercial Off The Shelf) equipment to drive
down costs raises several issues in the process of selecting
and implementing test processes and equipment.
This session will feature speakers from Prime contractors
in the area discussing innovative ways they have implemented
test, designed systems, and the use of COTS equipment.
Who Should Attend:
This session will benefit both test engineers and test
managers alike.
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