As the optical communications market evolves, jitter testing and reducing the overall cost of test have emerged as key technical and economic challenges in manufacturing test. Teradyne invites you to attend a short seminar which addresses both challenges and includes three focused presentations, a demonstration of Teradyne & Tektronix optical test solutions, and discussion of your specific test challenges over lunch with Teradyne's applications specialists. During the seminar, you will be presented with a new jitter testing technique which offers faster, more reliable measurements than traditional analog techniques. In addition, you will learn about test strategies that can lower the cost for testing optical components, modules and parallel optics devices.

Reserve your seat today and register to win a Handspring Handheld

Dates, Locations, Times

• Tuesday, June 25 2002
• 9am to 1pm (Lunch will be provided)
• Teradyne Inc.
• 1321 Ridder Park Drive
• San Jose, CA

Presentation Topics:

Reducing the Cost of Optical Test
Jitter Testing using Digital Phase Analysis (w/guest speaker Mark Powell, Tektronix)
Optimizing Manufacturing Test with Optical Switching

The seminar session will be followed by a product demonstration and a complimentary lunch.

Who should attend: Managers, manufacturing engineers and test engineers who are interested in optical test and reducing the cost of testing modules and active components.