| Denmark at Comwell Borupgaard,
Snekkersten,
on December 2 & 3 , 2003
Website : http://www.ittf.no
For more information on this program: Click
here
Teradyne is pleased to present the following technical
papers and/or participate in panel discussions at Nordic
Test Forum 2003:
Program : Tuesday, December 2, 2003
| 18:15 - 19:30 |
"Does AOI/AXI
remove the need for ICT and functional test
?" |
Panel moderator: Birger
Schneider
Pete Collins, JTAG Technologies
Gunnar Carlsson, Ericsson
Bengt Nilsson, Partnertech
Michael J.Smith, Teradyne
Stig Öresjö, Agilent
Bengt Magnhagen, Elektronikindustri-föreningen |
|
Wednesday, December 3, 2003
| 14:00 - 14:30 |
" The Effects
of Business and Technology on Image Inspection" |
Michael J. Smith, Teradyne |
|
|
