| Presented by Teradyne
A Free Web Seminar
To register, please click
here.
Danger - Low Voltage!
Teradyne has the technology for accurate, reliable,
and safe powered-up testing of new low-voltage technologies!
This web presentation discusses the challenges of performing
powered-up vector testing of low voltage technologies
and the fundamental problems they pose to conventional
in-circuit testers. It describes the ICT safe testing
protection technologies, available on Teradyne's TestStation™
in-circuit testers, that are used to ensure that test
vectors do not violate the increasingly tight specifications
of low voltage parts. Topics will include:
- Why manufacturers are adopting low voltage technologies
- What happens when low voltage components are exposed
to stressful conditions
- Accuracies of different ICT pin designs
- The importance of features that can report and control
harmful test events that unduly stress components.
Finally, the presentation will introduce attendees
to the TestStation LH, Teradyne's newest member of the
TestStation product family. The TestStation LH is a
price-reduced, feature-scalable, SafeTest ready, smaller
footprint version of the award winning TestStation 12X
product family..
Your host will be Alan Albee, In-Circuit Test Product
Manager for Teradyne's Assembly Test Division. He has
been working at Teradyne (and formerly GenRad) for almost
21 years in various engineering, applications, product
support and marketing positions. Alan has two patents
to his credit and has authored a variety of papers on
advanced in-circuit test techniques.
We hope that you can make the time to attend. Feel
free to forward this invitation to your colleagues to
join you for this informative Web seminar.
Dates, Location and Times...
Tuesday, May 20th
1:00 PM EDT, 10:00 AM PDT
Duration: 1 Hour
To register, please click
here.
For more information, please email: webinar@teradyne.com
We look forward to seeing you online! |
