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Are You Taking Risks with Low-Voltage Devices at In-circuit Test ?
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Do you have low-voltage devices on your PCBs? Do you know they may be vulnerable to over-voltage and over-current conditions during ICT on conventional in-circuit testers?

To find out more about this serious and growing problem, please join us for a special Teradyne PCB test & inspection technology seminar. The seminar will focus on the challenges and issues of testing low-voltage devices at in-circuit test. It will also feature an update on Teradyne solutions for test and inspection.

To Register online, Please click here

 
Date: Thursday, May 6, 2004
Time: 12:00 - 6:00 PM
City: Boston, Massachusetts
Location: Boston Park Plaza Hotel & Towers,
67 Arlington Street
 
  • Why You Should Attend:
    Low voltage devices present unique challenges and risks for electronics manufacturers during in-circuit test. Whether you have low-voltage devices on your printed circuit boards today or will face them tomorrow, now is the time to get up-to-speed on this important test issue.
  • Attend this seminar to learn more about the unique test & inspection solutions Teradyne has to offer. Find out the latest about Teradyne technologies and innovations, meet Teradyne experts, and see product demos.

Seminar Schedule:
12:00-1:30 PM
Buffet Lunch
Sign In & Registration

1:30-4:30 PM
Seminar Program

  • Technology Trends in Low-Voltage Devices
  • Issues in Testing Low-Voltage Devices at In-Circuit Test
  • Teradyne Product Overview & Technology Update

4:30-6:00 PM
Drinks, Hors d'oeuvres & Prizes
Informal Product Demos:

  • TestStation LH ICT
  • D2B (Design-to-Build) software

To Register online, Please click here

Attendance is FREE, but space is limited, so please register today. Please indicate if you will join us for lunch or not.

Any questions? Please contact Kim Otte at kim.otte@teradyne.com or 978-370-6222.

 

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