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Assembly Test & Inspection Solutions
you are here : Home > News & Events > Calendar Events > 2004 > 16062004 Seminar
News & Events
Are You Taking Risks with Low-Voltage Devices at In-circuit Test ?
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Do you have low-voltage devices on your PCBs? Do you know they may be vulnerable to over-voltage and over-current conditions during ICT on conventional in-circuit testers? SafeTest
To find out more about this serious and growing problem, please join us for a special Teradyne PCB test & inspection technology seminar. The seminar will focus on the challenges and issues of testing low-voltage devices at in-circuit test. It will also feature an overview of Teradyne's D2B (Design-to-Build) software.

Please register online at:
Registration is full
 
Date: Wednesday, June 16 2004
Time: 5:30 PM
Location: Hilton Guadalajara
City: Guadalajara, Mexico
 
  • Why You Should Attend:
    Low voltage devices present unique challenges and risks for electronics manufacturers during in-circuit test. Whether you have low-voltage devices on your printed circuit boards today or will face them tomorrow, now is the time to get up-to-speed on this important test issue.
  • Attend this seminar to learn more about the unique test & inspection solutions Teradyne has to offer. Find out the latest about Teradyne technologies and innovations, meet Teradyne experts, and see product demos.

Seminar Schedule:
5:30 - 6:00 PM
Sign In & Registration

6:00 - 8:30 PM
Seminar Program

  • Technology Trends in Low-Voltage Devices
  • Issues in Testing Low-Voltage Devices at In-Circuit Test
  • D2B (Design-to-Build) Software Overview

8:45 - 9:15 PM
Drinks, Hors d'oeuvres & Prizes
Informal Product Demos:

Please register online at:
Registration is full

Attendance is FREE, but space is limited, so please register today.

Any questions? Please contact Lucy Heredia at lucia.heredia@teradyne.com or 52.33.31.23.2345, extension 100.

 
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