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Assembly Test & Inspection Solutions
News & Events
The Impact of Low-Voltage Devices on Test and Inspection
Archive - 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001
Mark your calendars and plan to attend one of our special summer webinars on a hot topic: testing low-voltage devices safely at in-circuit test.
 
Impact of Low-Voltage Devices on Test & Inspection
Date/Registration Time
Webinars Completed :
June 30,2004 N. America = 8:00am EDT (GMT - 4hrs)
UK = 1:00pm
Central Europe = 2:00pm
Asia = 9:00pm
July 7, 2004
N. America = 3:00am EDT (GMT - 4hrs)
UK = 8:00am
Central Europe = 9:00am
Asia = 4:00pm
July 20, 2004 N. America = 12:00pm EDT (GMT - 4hrs)
UK = 5:00pm
Central Europe = 6:00pm
Asia = 1:00am
August 5, 2004
N. America = 2:00am EDT (GMT - 4hrs)
UK = 7:00am
Central Europe = 8:00am
Asia = 3:00pm
August 25, 2004
N. America = 3:00am EDT (GMT - 4hrs)
UK = 8:00am
Central Europe = 9:00am
Asia = 4:00pm
 

About the Webinar

ARE YOU TAKING RISKS WITH LOW-VOLTAGE DEVICES AT IN-CIRCUIT TEST ?

Do you have low-voltage devices on your PCBs? Do you know they may be vulnerable to over-voltage and over-current conditions during ICT on conventional in-circuit testers?

To find out more about this serious and growing problem, please join us for one of our special webinars from Teradyne. The webinars will focus on the challenges and issues of testing low-voltage devices at in-circuit test.

Why You Should Attend:

  • Low voltage devices present unique challenges and risks for electronics manufacturers during in-circuit test. Whether you have low-voltage devices on your printed circuit boards today or will face them tomorrow, now is the time to get up-to-speed on this important test issue.
Michael J.Smith Presenter: Michael J. Smith, Technologist,
Teradyne, Assembly Test Division

To find out more about this serious and growing problem, please join us for one of our special webinars from Teradyne.

For more information, please email: webinar@teradyne.com

We look forward to seeing you online!

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