Today's new designs are presenting some interesting test challenges. The avalanche of portable electronics has forced the need for extended battery life in many products. This has meant semiconductor houses have to produce devices with lower logic levels, which in turn causes potential problems for older and less able in-circuit testers. Space constraints are also reducing access and new package styles have neither electrical or visual access.

Teradyne has been investing heavily in In-circuit and XRay technologies to address the challenges. To find out more then please register today for a space at our upcoming seminars:

To register on-line, please click here

Teradyne Seminar Topics

The seminar will focus on the challenges and issues of testing low-voltage devices at in-circuit test.
Topics to be covered include:

• FrameScan FX - the next generation open test technology on UltraPin-Based TestStation.
• SafeTest - Testing low voltage devices and SafeTest protection technologies.
• ClearVue - introducing the new AXI technology
• XStation MX - a revolutionary 3D in-line automated imaging system.

Key Speakers:

• Mr. Alan Albee: TestStation product manager at Teradyne's Assembly Test Division. Alan holds a B.S. from Massachusetts State College and has worked in the ATE industry for more than 20 years.
  
• Mr. Paul Groome: General manager for Automatic X-Ray inspection group in California. With 14 years experience at Teradyne and over 20 years in the test and inspection industry. Mr. Groome has also worked in the telecommunications and military industries and developed the Modular Scan Techniques used in military decoder ASICs.

Who Should Attend:

• Test engineers and test engineering managers, design engineering managers, and quality assurance managers
• Current users of Teradyne and GR brands of ICT products

Why You Should Attend:

• Low voltage devices present unique challenges and risks for electronics manufacturers during in-circuit test. Whether you have low-voltage devices on your printed circuit boards today you will face them tomorrow, now is the time to get up-to-speed on this important test issue
• Attend this seminar to learn more about the unique test & inspection solutions Teradyne has to offer. Find out the latest about Teradyne technologies and innovations, meet Teradyne experts.

Seminar Schedule:

To register online, please click here. Be sure to check if you will join us for the morning session, afternoon session or both. Lunch will be provided for those joining us for the full day.

Attendance is FREE, but space is limited, so please register today.

Deadline to register is October 18, 2005.

Any questions? Please contact Tina Mohd, tina.mohd@teradyne.com