|
|
 |
 |
|
 |
| Calendar Events 2006 |
|
|
| Archive - 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 |
|
| New hardware and software enhancements to the TestStation In-Circuit Tester Platform |
9am EST and 3pm EST |
December 13, 2006 |
| Electronica 2006 |
Munich, Germany |
Nov. 14-17, 2006 |
| The Long and Short of Testing Shorts |
9am EST and 3pm EST |
October 25, 2006 |
| Logistics Officer Association (LOA) |
San Antonio, TX |
October 9-14, 2006 |
| Assembly Technology Expo |
Rosemont (Chicago) IL |
September 25-28, 2006 |
| Who Cares About Quality? |
9am EST and 3pm EST |
September 27, 2006 |
| Autotestcon 2006 |
Anaheim California |
September 18-21, 2006 |
| Leveraging Boundary-Scan Achieving Quality |
9am EST and 3pm EST |
August 9, 2006 |
| Avoiding Damage to Low-Voltage CMOS Devices During In-Circuit Test |
9am EST and 3pm EST |
July 26, 2006 |
| WPI Presents Analysis of Damage to Low Voltage CMOS Devices during In-Circuit Test |
3pm EST and 9am EST |
June 21, 3pm and June 22, 9am |
| LRU Test Methodologies and the Mixed-Signal Implications of Test |
2pm EST |
May 16, 2006 |
| Techniques & Trade offs of Pure-Pin and multiplexed ICT architectures |
9am and 3pm EST |
May 3 , 2006 |
TUG 2006 |
Ponte Vedra Beach, Florida |
May 1-3, 2006 |
| Understanding the Costs, Benefits and ROI of Adding AXI (Versus AOI) to an ICT Line |
9am and 3pm EST |
April 12, 2006 |
| Nepcon Shanghai |
Shanghai |
April 4, 2006 |
| Avionics Maintenance Conference (AMC) |
Paris France |
April 3-6, 2006 |
| Design for Test Methods |
9:00 a.m. and 3.00 p.m. EST |
March 8, 2006 |
| Dixie Crow Symposium |
Robins AFB, GA |
Mar 19-23, 2006 |
| The Economics of AXI |
9:00 a.m. and 3.00 p.m. EST |
March 8, 2006 |
| The Economics of In-Circuit Test |
9:00 a.m. and 3.00 p.m. EST |
February 22, 2006 |
New Wireless Fixturing Technologies |
9:00 a.m. and 3.00 p.m. EST |
February 8, 2006 |
Short-Wire Fixturing, Board Stress Analysis |
9:00 a.m. and 3.00 p.m. EST |
January 25, 2006 |
|
|
|
|
|
|
|
