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Assembly Test & Inspection Solutions
you are here : Home > News & Events > Press Room > Press Archive
News & Events
Press Release Archive
2013
02/13/2013 - Teradyne Presents the Evolution of In-Circuit Test Technologies at IPC APEX EXPO 2013
04/08/2013 - Teradyne to Debut New TestStation Systems at SMT Hybrid Packaging 2013 Conference
05/02/2013 - Teradyne Launches Zero-Footprint, Multi-Site TestStation System for Automated Inline Use
 
2012
01/10/2012 - UBM Electronics Announces the Finalists for the Test & Measurement World Best in Test Awards
02/22/2012 - Teradyne Presents Evolving In-Circuit Technologies at IPC APEX EXPO 2012
03/07/2012 - Teradyne Revamps Support Network Program, Introduces TSN Select Membership Level
4/19/2012 - Teradyne to Demonstrate Cost Effective Functional Test at NEPCON China 2012
5/11/2012 - Teradyne and Corelis Announce Agreement to Bolster Boundary-Scan In-Circuit Test Capability
12/05/2012 - UBM Tech’s Test & Measurement World Announces the Best in Test Finalists
 
2011
11/15/2011 - Teradyne Introduces TestStation™ PXI Functional Expansion Board at Productronica 2011
10/28/2011 - Teradyne Exhibits at Productronica 2011
4/12/2011 - Teradyne and JTAG Technologies Announce Boundary Scan Product Collaboration
03/2/2011 - Acculogic Purchases Teradyne TestStation LX System
02/21/2011 - Solution Sources Programming takes Delivery of Teradyne’s TestStation LX for Testing High Pin Count, High Complexity Printed Circuit Board Technologies
 
2010
09/30/2010 - Teradyne Extends Partnership with Accelonix in Europe
03/31/2010 - Teradyne Introduces Test Expert for Spectrum v9.0
 
2009
07/15/2009 - Compal Selects Teradyne TestStation LH for Notebook Testing
09/09/2009 - Teradyne Names Huawei 2008 Strategic Technology Partner
 
2008
10/28/2008 - Teradyne and JTAG Technologies Provide Test Solution for Advanced Digital Networks
 
2007
11/13/2007 - Teradyne Introduces TestStation Duo Concurrent In-Circuit Test System
11/12/2007 - GOEPEL electronic’s SCANFLEX® Boundary Scan Platform now integrated on Teradyne Spectrum 8800-Series
2/27/2007 - Teradyne Demonstrates Advanced In-Circuit Test and Automated X-Ray Inspection Systems at NEPCON China
 
2006
11/14/2006 - Teradyne Announces Debug Pro™ Test Programming and Debug Software for TestStation In-Circuit PCB Testers
11/14/2006 - Teradyne Expands TestStation Scalability with UltraPin II Pin Board Family
 
2005
12/22/2005 - Teradyne Wins Prestigious Best-in-Test™ Award
08/22/2005 - Teradyne Releases Upgrade to TestStation Software
04/25/2005 - Teradyne Announces FrameScan™ FX Advanced Vectorless Test Tool
03/23/2005 - Teradyne Unveils Advanced 3D X-Ray Imaging Technology, ClearVue™ Promises to Increase PCB Fault Coverage and Reduce False Failure Calls
 
2004
06/09/2004 - Harman Music Group Selects Teradyne Transmission X-Ray Product as Sole Test Platform
01/09/2004 - Teradyne Promotes Executive To Run Asia; Hires New Head Of Assembly Test Division
 
2003
11/11/2003 - Teradyne Introduces New XFrame Integrated Program Development Environment for XStation AXI Systems
09/30/2003 - Teradyne Launches New eKnowledge Self-Service Web Portal for Customers of PCB Test & Inspection Systems
06/10/2003 - Teradyne Introduces SafeTest™ Protection Technologies
05/07/2003 - Celebrating Twenty Years of the Teradyne Users Group -TUG-
04/04/2003 - Teradyne Awarded Two Service Excellence Awards at APEX; Customers Commend Teradyne's Assembly Test and Connection Systems Divisions
03/31/2003 - Teradyne Introduces TestStation LH In-Circuit Tester
 
2002
10/17/2002 - Teradyne and Tecnomatix Expand Alliance Tecnomatix Acquires Teradyne's CIMBridge CAD/CAM Optimization Software Product Line
08/27/2002 - Teradyne Introduces TestStation SE In-Circuit Tester Price and Performance Breakthrough for Volume Manufacturers
08/06/2002 - Teradyne Releases Design-to-Build Software V3.0 Software Maximizes Return on Test Investment
06/10/2002 - Teradyne Design-To-Build (D2B) Software Now Available On Optima™ Automated Optical Inspection Platforms
01/25/2002 - Teradyne Receives Service Excellence Awards at APEX Customers Give High Marks
01/23/2002 - Teradyne Introduces Z1888 Elite™ Cost-Reduced, Full-Function, In-Circuit Test System
01/11/2002 - Teradyne Expands Design-to-Build Leadership To Include All Test & Inspection Platforms
01/07/2002 - Teradyne's Flying Prober Test Solution Deployed At Benchmark
     
2000
03/14/2000 - New CC3 Lightning™ High Speed Channel Card Reduces Device Programming Time
02/23/2000 - Teradyne Test Equipment and Software Nominated for Evaluation Engineering Readers' Choice Award
     
 
 
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