| New M920 offers 50 MHz data rates,
128K pattern memory, hybrid pin capability, and wider
voltage levels
SALT LAKE CITY, UT - Aug. 25, 1998 - Teradyne (NYSE:
TER) announced a new 50 MHz channel card for its M9-Series
of VXI Digital Test Instruments today at AUTOTESTCON
'98 in Salt Lake City, Utah. In addition to faster data
rates, the new M920 channel card offers 128K of pattern
memory per channel, hybrid pins for greater flexibility
in mixed-signal testing, and increased voltage levels
to address a wider range of technologies. Teradyne has
received orders totaling $3.5 million for the M920.
The M920 channel card offers new price-performance
options for VXI system integrators.
The M9-Series offers compact, high-performance C-size
digital test instruments designed to meet the configuration
and performance requirements of VXI system integrators.
With a VXIplug&play Windows NT framework software
driver and hardware that is compliant with VXI interface
standards, M9-Series instruments are easily integrated
with other VXI-based instruments in automatic test systems
(ATS) and specialized test equipment (STE) for defense
and avionics programs. They have been integrated in
commercial-off-the-shelf (COTS) test equipment supplied
to the U.S. Department of Defense, including the U.S.
Marines Corps TETS and the Air Force JSTARS tester,
and designed into the Army IFTE program. M9-Series instruments
have also been designed into a number of third-party
test systems, including the Honeywell H3500, ManTech
Aurora and WesTest 2000.
"The M9-Series is the ideal solution for ATE suppliers
who need to upgrade the digital capabilities of their
legacy systems to meet the requirements for testing
modern defense electronics", said Andy Hutchinson,
Teradyne M9-Series product manager. "These instruments
deliver the high-performance capabilities required for
digital functional test, plus they provide all the advantages
of a standards-based, commercial-off-the-shelf product--easy
configurability, high reliability, and lower acquisition
and maintenance costs."
The new channel card offers 48 bidirectional, programmable-voltage
test channels with data rates from 100 Hz to 50 MHz.
With 128K of pattern memory per channel, the M920 has
the capacity to handle long pattern sequences efficiently
and capture complete pass/fail data for every pattern
in a single pass, ensuring efficient generation of high-resolution
fault-dictionary diagnostics. Hybrid pin capability
offers greater flexibility in mixed-signal testing.
Wider voltage levels - 20V range and 15V swing - enables
the M920 to address a broader range of technologies.
Volume shipments of the M920 begin in the first quarter
of 1999. Pricing in North America for a basic instrument
package, including one 50 MHz channel card, one Central
Resource Board (CRB), the VXIplug&play driver, and
a one-year warranty, is $54,500. An M9-Series instrument
can be configured with up to 11 M920 channel cards,
for a total of 528 digital test channels. Pricing for
each additional channel card can be obtained through
your sales engineer. M9-Series digital test instruments
can be configured with any VXIplug&play -compliant
slot 0 controller.
The M9-Series takes advantage of VXI interface standards
and advanced packaging techniques to provide more digital
test capability with greater cost efficiency and higher
reliability than has ever been available in a C-size
VXI instrument. The CRB supplies system-wide clock generation,
channel deskewing to maintain timing accuracy, and guided-probe
electronics for fault diagnosis. All other signal control
functions are distributed on the channel cards, which
provide the capabilities required for developing high-fault-coverage
functional tests:
- 1 ns edge placement resolution
- Absolute accuracy specified across all pins at the
UUT interface
- 256 timing sets, switchable on the fly, per pin
and per pattern
- Per-pin timing control
- Two sets of drive/detect levels, selectable per
pin
- 5 data formats selectable per pin
M9-Series digital test instruments accurately emulate
complex test signals and reliably deliver tests to a
unit-under-test (UUT), significantly reducing the time
and effort required to develop or rehost, integrate,
and debug test programs. The instruments can use the
VXI trigger bus or sync resources on the CRB for high-accuracy
triggering to support mixed-signal testing at high speeds.
The VXIplug&play Windows NT driver included with
the M9-Series provides a graphical soft front panel
for "benchtop" access and programming. The
driver also serves as a programmatic interface to all
Application Development Environments (ADEs) supported
in the Windows NT Framework as well as the TYX PAWS
ATLAS ADE.
Teradyne is the world's largest supplier of automatic
test equipment and software for the electronics and
telecommunications industries, and a leading supplier
of high-performance backplane assemblies and connectors.
The company's Assembly Test Division is a major supplier
of commercial-off-the-shelf (COTS) functional test systems
and test development software for board, box, and system-level
test. Headquartered in Boston, Massachusetts, Teradyne
reported 1997 sales of approximately $1.26 billion.
The company's address on the World Wide Web is www.teradyne.com.
TestStudio, VICTORY, and Spectrum 9000-Series are trademarks,
and LASAR is a tradename, of Teradyne, Inc. All other
product names are trademarks of their respective owners.
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