About Teradyne   |   Investors   |   Careers   |   Contact   |   Teradyne.com

Search   All of Teradyne atd atd-ict atd-axi atd-factory atd-functional atd-milaero atd-testdesign Adv Search | Sitemap you are here : Home > News & Events > Press Room > Press Releases > 2002 2002 Press Releases   October 2002 10/17/2002 - Teradyne and Tecnomatix Expand Alliance Tecnomatix Acquires Teradyne's CIMBridge CAD/CAM Optimization Software Product Line 10/11/2002 - Teradyne Introduces Bi4-Series™ Industry's First "Synthetic" Bus Test Instrument   September 2002 09/24/2002 - Teradyne Expands Relationship with Test Solutions Ltd 09/03/2002 - Teradyne Delivers High-Speed Optical Inspection and Local Support to Beijing International Switching Systems Corporation 09/03/2002 - Teradyne Features Latest Technologies At Globaltronics Advanced Systems Meet Needs of Asia Pacific Manufacturers   August 2002 08/27/2002 - Teradyne Introduces TestStation SE In-Circuit Tester Price and Performance Breakthrough for Volume Manufacturers 08/06/2002 - Teradyne Releases Design-to-Build Software V3.0 Software Maximizes Return on Test Investment   June 2002 06/10/2002 - Teradyne Design-To-Build (D2B) Software Now Available On Optima™ Automated Optical Inspection Platforms   May 2002 05/20/2002 - Teradyne and Sony Collaborate On Unique Cellular Mobile Test Solution   April 2002 04/03/2002 - Teradyne Features Value, Technology at Nepcon Shanghai Asia-Pacific Region Introduced To Most Comprehensive Line Of Test And Inspection Solutions In Industry   March 2002 03/19/2002 - Teradyne Expands GR VersaOT Optical Test Platform New Amplifier Accelerates Optical Test, Reduces Costs 03/06/2002 - Intertechnique Migrates to Teradyne's Spectrum 9100   February 2002 02/18/2002 - Teradyne Reaches Product Milestone with Spectrum™ 9000-Series Functional Test Platform 02/14/2002 - Teradyne Recognized for Product Innovation Optima 7350 AOI System Named 'Best in Test'   January 2002 01/25/2002 - Teradyne Receives Service Excellence Awards at APEX Customers Give High Marks 01/23/2002 - Teradyne Introduces Z1888 Elite™ Cost-Reduced, Full-Function, In-Circuit Test System 01/22/2002 - Teradyne Launches New Products to Boost Electronics Manufacturers' Competitiveness 01/11/2002 - Teradyne Introduces Leading Test Solutions To Asia-Pacific Audience at Japan's InterNepcon 01/11/2002 - Teradyne Expands Design-to-Build Leadership To Include All Test & Inspection Platforms 01/07/2002 - Teradyne's Flying Prober Test Solution Deployed At Benchmark 01/03/2002 - John Casey Appointed President of Teradyne Assembly Test Division; Casey Replaces Robert Dutkowsky     Select a Section ----------------------------- ATD Home About ATD Request a Sales Call Newsletter Signup! Division Location Products News & Events -- Press Room -- Current Press Releases -- Newsletter -- Web Seminars -- Calendar Events Resource Center -- Browse by Type -- Browse by Product Browse TSN Members Contact Support Contact Us Request Information Resource Center eKnowledge Login Training at Teradyne

©Teradyne Inc. 1994-2012 All rights reserved. Terms of Use | Privacy Statement | Feedback