| — Versatile C-size VXI-based test instruments feature an unmatched combination of performance, density
flexibility and usability for military and aerospace/avionics test applications.
North Reading, MA, September 27, 2005 - Teradyne®, a leading manufacturer of military and aerospace test solutions, today announced a new line of high-performance digital test instruments. The Di-Series represents the industry’s most technologically advanced family of C-size VXI-based digital test instruments and builds upon Teradyne’s widely adopted M9-Series by increasing performance and adding key new features for emerging applications. The Di-Series features highly configurable, independently programmed channels designed to address a broad range of test requirements from board through subassembly test.
Walter Vahey, general manger of Teradyne’s Military and Aerospace Business Unit, said, “The Di-Series has four key features that directly benefit test developers: compatibility, flexibility, performance and usability. Our new Di-Series instruments are standards-based and compatible with Teradyne equipment to preserve earlier TPS (Test Program Set) investments. They have the flexibility required to test a range of UUT (Unit Under Test) assemblies from board to boxes and effectively replace legacy equipment with a smaller footprint. They deliver unmatched performance, resulting in the highest quality of test for both old and new designs while helping simplify the entire development/debugging environment and make test operations easier and more cost effective.”
Four key attributes of the Di-Series:
- Compatibility with the M9-Series and other instruments is preserved by the Di-Series’ ability to directly run M9-Series programs and translate digital programs from Teradyne L-Series testers.
- Flexibility is well suited to the highest levels of assembly, such as box-level LRU (Line Replaceable Units) or WRA (Weapons Replaceable Assemblies). In addition, Di-Series cards can be partitioned to form multiple autonomous “virtual” instruments, each of which can simultaneously address different portions of the test problem while interacting with the UUT.
- Performance enhancements include the ability to directly test differential logic, including high-speed LVDS (Low Voltage Differential Signaling).
- Usability is enhanced by the per-channel programming of signal timing and levels and by Teradyne’s iStudio™ development and debugging software. iStudio is a graphical user interface that allows test developers to interactively learn about the instrument, create patterns, and debug tests that can be incorporated into all standard TPS development environments.
The Di-Series of digital test instruments will be publicly demonstrated for the first time at AUTOTESTCON 2005 (Booth #1101) in Orlando, Florida starting on September 27th. For more technical information about the new Di-Series of digital test instruments, visit www.teradyne.com/militaryaerospace/digital-testing-products/diseries.html or contact a Teradyne sales representative.
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2004, Teradyne had sales of $1.8 billion, and currently employs about 5,700 people worldwide. For more information, visit www.teradyne.com. Teradyne is a registered trademark of Teradyne, Inc. iStudio is a trademark of Teradyne, Inc.
Editorial Contact:
Peter Predella
Teradyne Asssembly Test Division
978.370.1401
peter.predella@teradyne.com
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