— The Ai-760’s advanced system-per-pin architecture will facilitate parallel testing, reduce test times and increase fault coverage by more accurately emulating complete system-level operation.

North Reading, MA, September 27, 2005 - Teradyne^®, a leading manufacturer of high-performance military and aerospace test and inspection solutions, today announced the development of a new, high-performance analog test instrument. The high-density Ai-760 will allow test system integrators to construct more advanced analog and mixed-signal ATE, achieve higher levels of functionality and attain superior performance in a much smaller form factor.

The VXI-based C-size Ai-760 will feature parallel source and measure capability for faster TPS (Test Program Set) throughput and high-speed functional and operational analog testing. Walter Vahey, general manger of Teradyne’s Military and Aerospace Business Unit, said, “The Ai-760’s advanced system-per-pin architecture will significantly reduce test times and increase fault coverage by more accurately emulating complete system-level operation. It will feature higher fidelity performance and pack more I/O (Input/Output) functionality into a single VXI slot. Its superior specifications and functional density will benefit systems integrators as they strive to reduce test assets, consolidate VXI slots and scale down the test solution footprint.”

Two configurations of the Ai-760 will feature eight single-ended (four differential) system-per-pin channels, including up to sixteen 200 MHz universal timers, 50 MSa/s 12-bit digitizers and 50 MHz 12-bit arbitrary waveform generators. The Ai-760 will also include a 6.5-digit digital multimeter and a 2-channel 1 Gsps digital sampling oscilloscope.

The Ai-760 will increase functionality and reduce the number of instruments needed by a test system-thereby decreasing system complexity, footprint, programming, support and cost of ownership. VXI system integrators can use the Ai-760 to build and customize high functional test platforms and satisfy the many test requirements common to military and avionics equipment.

The Ai-760 is slated for production in 2006.

For advanced technical information about the Ai-760 analog test instrument, visit www.teradyne.com/militaryaerospace/digital-testing-products/ai760.html or contact a Teradyne sales representative.

About Teradyne

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection systems. The company's products deliver competitive advantage to the world's leading semiconductor, electronics, automotive and network systems companies. In 2004, Teradyne had sales of $1.8 billion, and currently employs about 5,700 people worldwide. For more information, visit www.teradyne.com. Teradyne is a registered trademark of Teradyne, Inc. iStudio is a trademark of Teradyne, Inc.

Editorial Contact:
Peter Predella
Teradyne Asssembly Test Division
978.370.1401
peter.predella@teradyne.com