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ATD Search   All of Teradyne atd atd-ict atd-axi atd-factory atd-functional atd-milaero atd-testdesign Adv Search | ATD Sitemap you are here : Home > News & Events > Press Room > Press Releases > Press Releases by Product Automated X-Ray Inspection Press Releases   2005 12/22/2005 - Teradyne Wins Prestigious Best-in-Test™ Award 03/23/2005 - Teradyne Unveils Advanced 3D X-Ray Imaging Technology, ClearVue™ Promises to Increase PCB Fault Coverage and Reduce False Failure Calls   2004 06/09/2004 - Harman Music Group Selects Teradyne Transmission X-Ray Product as Sole Test Platform   2003 11/11/2003 - Teradyne Introduces New XFrame Integrated Program Development Environment for XStation AXI Systems   2002 09/24/2002 - Teradyne Expands Relationship with Test Solutions Ltd 09/03/2002 - Teradyne Delivers High-Speed Optical Inspection and Local Support to Beijing International Switching Systems Corporation 06/10/2002 - Teradyne Design-To-Build (D2B) Software Now Available On Optima™ Automated Optical Inspection Platforms 04/03/2002 - Teradyne Features Value, Technology at Nepcon Shanghai 02/14/2002 - Teradyne Recognized for Product Innovation Optima 7350 AOI System Named 'Best in Test' 01/22/2002 - Teradyne Launches New Products to Boost Electronics Manufacturers' Competitiveness 01/11/2002 - Teradyne Introduces Leading Test Solutions To Asia-Pacific Audience at Japan's InterNepcon   2001 10/11/2001 - GenRad Delivers Best Rework Station Performance For Global Printed Circuit Board Manufacturers 10/02/2001 - GQuay Buys GenRad's GR XStation 3D X-Ray Systems; New Technology Key Part of Quality Strategy 07/16/2001 - GenRad Sets New Industry Standard With X-Ray Failure Analysis Solution Introduced at SEMICON-West Show 05/08/2001 - Excelsior Deploys GenRad X-Ray Technology; Slashes Test Time from 30 Minutes to 4 Minutes 02/21/2001 - GenRad Sets New Performance Standard With Introduction of 2 X-Ray Test Systems 01/15/2001 - Teradyne Introduces the Optima 7200 Post-Placement Automated Optical Inspection (AOI) System; Advanced defect detection and process monitoring of SMT component placement   2000 10/17/2000 - Teradyne Opens New Assembly Test Division Office in Guadalajara   1998 03/03/1998 - Teradyne Demonstrates Automated Optical Inspection System With Custom Framegrabber, PentaVision Camera System at Nepcon West     Select a Section ----------------------------- ATD Home About ATD Request a Sales Call Newsletter Signup! Division Location Products News & Events -- Press Room -- Current Press Releases -- Newsletter -- Web Seminars -- Calendar Events Resource Center -- Browse by Type -- Browse by Product Browse TSN Members Contact Support Resource Center Support & Services

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