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ATD Search   All of Teradyne atd atd-ict atd-axi atd-factory atd-functional atd-milaero atd-testdesign Adv Search | ATD Sitemap   Request a Sales Call ? Click here to get more information. Newsletter Signup! Click here   you are here : Home > Resource Center > Product > Ai7 Series Military and Aerospace Test Solutions - Ai7 Series   Product Data Sheets Format Size Teradyne Ai-760 Analog Test Instrument "Versatile C-size VXI instrument for Defense and Aerospace applications" 541Kb Ai-710 Analog Test Instrument Subsystem "High-Density VXI C-Size Options for Parallel Analog Test" 413Kb Technical Papers Format Size "Design Approaches for Developing a High Density, High Performance Analog Test Instrument" Autotestcon 2008 554Kb "Optimizing Test Systems for Operational Test Benefits Using Parallel Test Capable Instruments" Autotestcon 2008 410Kb "Analog Functional Testing at the Board and Box Level" Steve Fairbanks, Autotestcon 2000 130Kb "Ai7-Series™ wins Product of the Year" VXIbus Newsletter, November 2000 527Kb Copyright © 2009 IEEE. Reprinted from Autotestcon 2009. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Teradyne’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing topubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.   On Demand Web Seminars Analog Instrumentation Workshop View Recording Presentation   LRU Test Methodologies and the Mixed-Signal Implications of Test View Recording Presentation   Analog Test Workshop View Recording     Strategies for Replacing Legacy ATE View Recording     Reducing TPS Runtime View Recording Presentation   CSI Core Promise Webinar View Recording Presentation   Select a Section ----------------------------- ATD Home About ATD Request a Sales Call Newsletter Signup! Division Location Products News & Events -- Press Room -- Current Press Releases -- Newsletter -- Web Seminars -- Calendar Events Resource Center -- Browse by Type -- Browse by Product Browse TSN Members Contact Support Product Quicklist ------------------------------ *In-Circuit Systems* -- TestStation -- TestStation LX -- TestStation LH -- TestStation SE 8862 -- Spectrum 8855xp *In-Circuit Options* -- Scan Pathfinder -- BasicScan -- SFTM -- FrameScan -- DSM -- AFTM -- FTI -- VCI -- MultiScan -- CC3 Lightning -- ILDP *CAD Prep Software* -- D2B Alchemist -- D2B Strategist -- D2B DesignView -- D2B Probe Placement *AXI Systems* -- XStation MX *AXI Options* -- XFrame -- XVer Repair Station -- XStat *Functional Test Systems* -- Spectrum 9100-Series *Mil/Aero Products* *Test Instruments* -- M9-Series -- Di-Series -- Ai7-Series -- Bi4-Series *Test Software* -- LASAR -- VICTORY -- TPS Converter Studio *Factory Reconditioned* *Service* -- Applications Support -- Hardware Agreements -- Software Agreements -- Training Support & Services Test Industry Sites Magazines

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