| Circuit
Board & Assembly Test Division Profile |
 |
5.4Mb |
MemTest™
"Fast
Ram/Rom Test Generation for the CASS Digital
Test Unit" |
|
33Kb |
MultiScan™
"Teradyne's Vectorless Test System" |
|
157Kb |
| Test & Inspection Technology Summary |
|
1.7Mb |
Resumen
Technológico de Prueba e Inspección (Spanish) |
|
686Kb |
| Teradyne
Paperless Repair Station |
|
90Kb |
"ATML and 'dot' Standards Status"
Autotestcon 2008 |
|
398Kb |
"Design Approaches for Developing a High Density, High Performance Analog Test Instrument"
Autotestcon 2008 |
|
554Kb |
"Advantages of Digital Convergence for Functional Test"
Andrew Hutchinson, Autotestcon 1998 |
|
65Kb |
"High Performance Component Software Changes the Rules for Configuring ATE"
Phillip Stern, Autotestcon 1997 |
|
82Kb |
"Management of DPMO Metrics Reduces the Cost of PCB Assembly"
Amit Verma, APEX 2003 |
|
306Kb |
"Rehosting Legacy Test Program Sets from Military ATE"
John Arena, Autotestcon 1997 |
|
69Kb |
"Functional Test in a High Density PCB Environment"
Bob Stasonis, Teradyne, Inc. |
|
280Kb |
"Open Strategy Tools Synthesize Better Defect Detection Between Multiple Inspection & Test Systems"
John Arena, Teradyne, Inc. |
|
222Kb |
"Using Microprocessor and DSP Debug Interfaces for Manufacturing Functional"
Billy Fenton, eTronix Conference 2001 |
|
50Kb |
Copyright © 2009 IEEE. Reprinted from Autotestcon 2009.
This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Teradyne’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing topubs-permissions@ieee.org.
By choosing to view this document, you agree to all provisions of the copyright laws protecting it. |
| Design for Test Methods |
|
| Short Wire Technologies, Board Stress Analysis |
|
| Fixturing Guidelines and Best Practices |
|
| Integrated In-Line Test & Inspection |
|
"Banking on Future Technology"
Fujitsu |
|
128Kb |
"Making Strides with D2B™ (Design-to-Build) Software"
Reptron Manufacturing Services |
|
707Kb |
"The Flexible Friend"
Kapsch AG |
|
44Kb |
"The Global Provider"
Celestica |
|
135Kb |
"State of the Art at Tecwings"
Tecwings |
|
20Kb |
"Welwyn Systems on the Right Lines"
Welwyn |
|
36Kb |
ATE for Avionics
Avionics Magazine, Barry Rosenberg, September 2007 |
|
1.84Mb |
"Instruments for Automatic Test"
IEEE, Eric Trubenbach, March 2005 |
|
1.53Mb |
"Challenges
for the test engineer"
Printed Circuit Europe, Kevin Paton, April
2003 |
|
276Kb |
"Changing
Times in Test Strategy"
Electronic Packaging
and Production, Amit Verma & Paul Hannon, May 2002 |
|
597Kb |
"Complementary
Test Strategies on High-Complexity Boards"
Circuits Assembly, Amit Verma, Mark Ogden & John Kokoska, August 2000 |
|
4.64Kb |
"Effective Test Strategies for Modern Printed Circuit Assemblies"
Nov 2001 |
|
2.02Mb |
"Effective
Test Strategies for Modern Printed Circuit
Board Assemblies"
Electronics Engineering Times China, August
2002 (Chinese) |
|
1.82Mb |
"Gigabit
Ethernet Test Challenges On The Manufacturing
Floor"
EET Asia, Kevin Paton, January 2003 |
|
499Kb |
"Gigabit
Ethernet Test Challenges On The Manufacturing
Floor"
(Chinese Version 1) |
|
1.3Mb |
"Gigabit
Ethernet Test Challenges On The Manufacturing
Floor"
(Chinese Version 2) |
|
1.4Mb |
"Kostenreduktion
mittels DPMO-Methode - Teil 1"
Productronic, Amit Verma, May 2003 |
|
73Kb |
"Kostenreduktion
mittels DPMO-Methode - Teil 2"
Productronic, Amit Verma, June 2003 |
|
71Kb |
"Optimizing
Test where ICT Access is Limited"
October 2002 |
|
286Kb |
"Step
by Step: Test/Inspection"
Surface Mount Technology,
Michael J. Smith, September 2002 |
|
88Kb |
"Switching
to Lead-Free Solder: Test & Inspection
Issues"
OnBoard Technology, Michael J. Smith, April
2004 |
|
395Kb |
"Teradyne
Pushes for Overall Test Solution"
Electronic Engineering Times
Asia, Mario Pereira, September 2002 |
|
52Kb |
"Test
and Inspection"
Surface Mount Technology, John Arena & Roy McKenzie,
Oct 2001 |
|
75Kb |
"The
Framework Implementation Project"
Circuits Assembly, Andrew Dugenske, March 2001 |
|
114Kb |
"The
Functional Test Revival"
Printed Circuit Europe, June 2001 |
|
560Kb |
"Une
stratégie de test? C'est d'abord une
question de dosage des différentes
techniques."
Mesures, Amit Verma, April 2003 |
|
7.2Mb |
"Ericsson
Creates Innovative Test Solutions with the
Help of Teradyne"
Teradyne Quarterly Newsletter, July 1999 |
|
119Kb |
