Automated X-Ray Inspection Strategies for High Volume Resource-constrained Production Environments

Automated X-Ray Inspection Strategies for High Volume, Resource-Constrained Production Environments – Web Seminar

This Webinar has been designed to address the following questions and issues:

Are you considering a production test strategy that includes an Automated X-Ray Inspection (AXI) system?

Do you have a need for in-line inspection solutions for high volume, resource constrained environments?

Combining AXI with in-circuit test methods improves defect coverage. The benefits of AXI become more evident when manufacturers are concerned about the field reliability of their products or face a loss of electrical and visual test access. Although the benefits of AXI are clear, what about the costs (some X-Ray inspection systems are expensive and slow)?

Does rework of insufficient solder joints by hot-iron repair or by removing/re-attaching components really improve the delivered quality of your products?

Is “inspect everything, repair everything” the use model for AXI that the industry is moving toward?

We need to consider the capabilities of automated inspection systems before implementing them in resource-constrained production environments. A new test strategy has emerged: in-line, high throughput AXI systems are available to match the beat rate of your product line.

In this web seminar, you will learn about the capabilities of Automated Inspection systems, and how to implement a solution to reduce the cost of ownership of an Automated X-Ray inspection test strategy by 66% while matching the beat rate of your production line.

About the speaker:

Amit Verma is a Business Development Engineer at Teradyne Inc. in San Diego, California. Mr. Verma has over 8 years of experience designing distributed test strategies. Prior to joining Teradyne, Mr. Verma was a Staff Engineer at a large EMS provider where he played a major role implementing test strategies and purchasing ATE hardware.

Mr. Verma is the chair of the National Electronics Manufacturing Initiative (NEMI) “Test Strategy” project and initiated the “DPMO” project; both projects have broad participation from leading professionals in the electronics manufacturing industry. Mr. Verma also co-chairs the IPC “Automatic Inspection Technologies Subcommittee (7- 32)”