"The Best in Test"
Test & Measurement World |
December 2005 |
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879Kb |
"Teradyne's 3D X-Ray Inspection System"
Circuits Assembly, Mike Buetow |
December 2005 |
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371Kb |
"Lead-Free and AXI Inspection Technologies"
SMT magazine, Paul Groome |
November 2005 |
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125Kb |
"Xray Systems Sharpen Images"
Test & Measurement World |
October 2005 |
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149Kb |
"PCB Inspection Shifts to AXI"
EE, Paul Groome |
October 2005 |
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0.97Mb |
"Imager Inspects complex boards"
Electronic Engineering Times, Chappell Brown |
April 2005 |
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193Kb |
"Testing Low-Voltage Devices during In-Circuit Test"
EM China, Alan Albee |
May 2004 |
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1.51Mb |
"Keep pc-board testing from harming low-voltage ICs"
Alan Albee |
November 2003 |
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83Kb |
"In-Circuit Test Meets Next Challenges"
EPP Europe, Alan Albee |
October 2003 |
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242Kb |
"The Challenges of Testing Low Voltage Technologies at In-Circuit Test"
Electronics Manufacturing China, Alan Albee, (Chinese) |
September 2003 |
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1.45Mb |
"Management of DPMO Metrics Reduces the Cost of PCB Assembly"
Global SMT & Packaging, Amit Verma |
April 2003 |
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415Kb |
"Teamster for Global Manufacturing"
EPP Europe, Amit Verma |
March/
April 2003 |
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60Kb |
"Optimizing Test Strategies During PCB Design For Boards With Limited ICT Access" (Spanish Version)
Electrónica, Amit Verma |
February 2003 |
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383Kb |
"Issues of Fault Coverage and Quality"
EPP Europe, Amit Verma |
January/
February 2003 |
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88Kb |
"Between Pressures and Remedies"
EPP Europe, Amit Verma |
November/
December 2002 |
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89k |
"Optimizing Test where ICT Access is Limited"
Printed Circuit Europe, Amit Verma |
October 2002 |
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286Kb |
"Combining ICT And Boundary Scan Testing"
OnBoard Technology, Alan Albee |
Jun 2002 |
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174Kb |
"Backdrive Current-Sensing Techniques Provide ICT Benefits"
Evaluation Engineering, Alan Albee |
February 2002 |
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210Kb |
"A Testing Time for Contract Manufacture"
Electronics Manufacturing & Products Europe |
May 2001 |
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210Kb |
"The CEM at the Center"
Companies are finding new ways to get production lines ready
Electronics Times |
March 2001 |
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120Kb |
"Extend the frontiers of boundary-scan test"
Teradyne Test and Measurement, David Rolince |
Feb 2001 |
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113Kb |
"Avoid the Common Pitfalls When Designing Boundary-Scan Boards"
Electronic Design Magazine, Harry Jin |
May 2000 |
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682Kb |
"Bridging the Islands of Test"
Circuits Assembly Magazine Article |
September 1999 |
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376Kb |
