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Technical Papers

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Technical Papers	Format	Size
Ai7-Series
"Analog Functional Testing at the Board and Box Level" Autotestcon 2000		130kb
M9-Series
"High Performance Digital Test in VXI: Designing Instruments As Systems" Autotestcon 1997		44Kb
"Integrating COTS VXI Hardware and Software for the Marine Corps Third Echelon Test System" Autotestcon '98		328Kb
"Specifying an IVI For Digital Test Instrumentation" Autotestcon 1999		104Kb
Design-to-Build
"Optimizing Test Strategies During PCB Design For Boards With Limited ICT Acces" Telecom Hardware Solutions Conference & Exhibition 2002 Charles Robinson and Amit Verma, Teradyne Inc.		123Kb
"Open Standards-based Software Tools Optimize the PCB Manufacturing Enterprise" Simon Jones, Teradyne Inc.		163kb
"Optimierung der Baugruppen-Produktion mit Softwarewerkzeugen auf der Basis von offenen Standards" (German) Simon Jones, Software Scientist, Teradyne Inc.		128Kb
LASAR
"Applying Virtual Test Principles to Digital Test Program Development" Autotestcon '97		34Kb
"Using Worst Case Timing Analysis to Assure High Fault Coverage in Functional Board Testing" IEEE VLSI Workshop and Symposium, 1989		446Kb
"What makes a good fault dictionary?" Technology Backgrounder, '92		754Kb
VICTORY
"A Roadmap for Boundary-Scan Test Reuse" International Test Conference 1996		51Kb
"Automatic Test Generation, Diagnostics, and Design Tools for Virtual Component and Cluster Testing" Nepcon West '93		1.2Mb
"BSML: An Application of XML to Enhance Boundary-Scan Test Data Transportability" Autotestcon 2001		48Kb
"Hiercharchical Test Generation: Taking Boundary Scan to the Next Level" Autotestcon 1996		686Kb
Leveraging Web and XML Technologies for Boundary-Scan Test Debug Etronix 2001		45Kb
"Using Boundary Scan with a Fault Dictionary To Test and Diagnose Clusters of Non-Scan Logic" Autotestcon 1996		33Kb

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