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Assembly Test & Inspection Solutions
Resource Center
Technical Papers
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Technical Papers Format Size
"Advantages of Digital Convergence for Functional Test"
Autotestcon 1998
pdf 65Kb
"Functional Test in a High Density PCB Environment"
Bob Stasonis, Teradyne, Inc.
pdf

280Kb

"High Performance Component Software Changes the Rules for Configuring ATE"
Autotestcon 1997
pdf 82Kb
"Management of DPMO Metrics Reduces the Cost of PCB Assembly"
APEX 2003
pdf 306Kb
"Open Strategy Tools Synthesize Better Defect Detection Between Multiple Inspection & Test Systems"
John Arena, Director of Marketing
Teradyne Assembly and Test Division
pdf 222Kb
"Rehosting Legacy Test Program Sets from Military ATE"
Autotestcon 1997
pdf 69Kb
"Using Microprocessor and DSP Debug Interfaces for Manufacturing Functional Test and Diagnosis" pdf 50Kb
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