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XStation MX - Automated 3D X-Ray Inspection
 

XStation MX - Click on Image to enlargeAutomated X-Ray inspection (AXI) is non-evasive and when integrated with in-circuit test, AXI equipment can increase fault coverage to nearly 100% of all process and electrical defect classes.

The Cost of High False Calls
If you are using AXI or AOI today, take a look at the cost of inaccurate diagnostics. Are you using a system with 3000, 5000, 10000 ppmJ or more false fail rates, the cost of these errors is high. 

The XStation MX  is our full-featured AXI system and provides the following savings:

  • Reduced escapes
  • Expense reduction around the repair and verification process
  • Reduction of component and product scrap
  • Reduced repair and verification cycle times

Key Features

  • Patented ClearVue™ 3D Automated X-Ray Technology
  • Patented TraX™ high throughput 2D Automated X-Ray Technology with expanded field-of-view capability
  • XStat™ statistical process control module that generates defect reports
  • Strategist™ coverage planning software
  • XVer Repair and Verification provides networked access to all defects with high quality images
  • X-Frame™ GUI based integrated program development environment
  • Lowest False Fail Rates
  • Full defect coverage on all component types
  • Lead-free ready
  • Fully Automated SMEMA compatible operation
 
TraX 2D X-Ray Inspection Technology

TraX™ 2D imaging technology provides the highest level of fault coverage with the lowest False Call Rates in the Industry for single sided boards. 2.2 FOV - Click on Image to enlargeUsed on over 250 Teradyne AXI systems in the field, TraX provides throughputs up to 6 Sq inches per second, as fast as any AOI system.

TraX technology provides the best performance; low false fails, high fault coverage and high throughput that suits customers in high volume high reliability environments such as Automotive manufacturers. On single sided boards no fault coverage is lost and TraX provides the highest level of inspection on these structural defects.

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Best in Test 2006 - Test & Measurement World
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Related Information:
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