Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Catalyst

The First. And Still Testing the Best.

With full spectrum instrumentation, broad configurability, and multi-site test, the Catalyst test system delivers full test coverage for a wide range of semiconductor applications, including xDSL, wireless/RF, networking, and power management. And with the Teradyne Tiger™ test system, the Catalyst family extends its range to more pins and Gigahertz speed.

The Catalyst SOC test system was the first, and now it's the world's leading SOC test system with over 1600 systems installed at customers around the world.

  • Fully integrated analog and digital instrumentation
  • Mixed-signal/SOC digital with data rates to 400 Mbps
  • Full Spectrum AC instrumentation
  • Background-DSP™ processing - Catalyst's parallel computer architecture reduces overall test time
  • IMAGE™ programming system with interactive debug displays and complete test engineering tools for device characterization
  • System architecture that accelerates test development and high-volume production for ICs with complex digital, embedded memory, and high-performance analog components