The Teradyne FLEX Test Family raises the bar for multisite semiconductor testing. This next-generation test architecture delivers efficiency and flexibility, reducing the number of testers you need to buy and dramatically cutting your cost to test.
Incorporating the full range of capabilities for testing today's - and tomorrow's - devices, FLEX covers the widest range of technologies and test strategies. That means you can harness the significant power of the FLEX Architecture for any device, in any market.
The FLEX Advantage
Remarkable efficiency, maximum test throughput, simplified test development and a scalable architecture - find out how the FLEX Architecture meets the toughest testing needs.
The Right Test Solution
All of the benefits of FLEX are available in a family of systems, each designed for specific testing requirements.