Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Flex Test Family

The FLEX Test Family

The best test economics, the broadest technology coverage

The Teradyne FLEX Test Family raises the bar for multisite semiconductor testing. This next-generation test architecture delivers efficiency and flexibility, reducing the number of testers you need to buy and dramatically cutting your cost to test.

Incorporating the full range of capabilities for testing today's - and tomorrow's - devices, FLEX covers the widest range of technologies and test strategies. That means you can harness the significant power of the FLEX Architecture for any device, in any market.

 

The FLEX Advantage

Remarkable efficiency, maximum test throughput, simplified test development and a scalable architecture - find out how the FLEX Architecture meets the toughest testing needs.

>> Learn More about FLEX Architecture

 

The Right Test Solution

All of the benefits of FLEX are available in a family of systems, each designed for specific testing requirements.

>> Learn more about FLEX systems