ESA Toolkit - Semiconductor Test

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Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

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Embedded Signal Analyzer (ESA) Toolkit

Design and Test Engineering Can Now Use the Same Tools

Teradyne integrated industry-leading vector signal analysis software tools and functions into Teradyne's IG-XL software and enhanced it with an extensive wireless waveform library for use on the UltraFLEX test system. Teradyne's Embedded Signal Analyzer (ESA) Toolkit enables test engineers to use the same signal analysis tools currently used by designers for characterization and incur zero test time penalty in production test with UltraFLEX Background DSP architecture for computing complex measurements such as EVM and spectral mask. With this industry first, test engineers can now dramatically reduce program development and debug time for modulated signal analysis common in wireless device test and accelerate time-to-market for wireless devices such as W-CDMA, WLAN 802.11n, WiMAX, LTE and more.

Features

• Support for 20+ Wireless Standards

• Signal Definition Explorer and Library for waveform generation

• Integrated indusry-leading VSA software for signal analysis

• UltraFLEX Background DSP support for all measurements to minimize test time

To learn more about the ESA Toolkit –

• Contact your local Teradyne Sales Engineer or

• Send for further information.

VSA Debug Display