Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Flex Test Platform

 

FLEX


The best cost of test for midrange mixed signal and SoC applications

 

The FLEX test system delivers cost-efficient multisite production test for devices operating operating under 200 MHz digital speed. Choose FLEX for testing mid-range devices for power management, RF, microwave, automotive, audio and video. With FLEX, you optimize capital investment while achieving superior performance and throughput.


FLEX highlights

  • Cost-efficient test up to 200MHz. Ideal for analog, digital and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications.
  • A broad range of instruments. Choose from a comprehensive suite of analog and digital instrument boards to configure your test solutions.
  • Configuration flexibility for high site-count parallel test. Standard capacity, air-cooled test head has 24 universal slots to accommodate a complete set of instruments, and can easily be reconfigured for different test strategies.
  • All the resources you need. Separate mainframe cabinet includes:
    • Power distribution unit
    • Clock reference
    • 19” rack space for mounting additional instrumentation
    • Integrated manipulator
    • Air cooling resources