Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

 

The FIRST Fully Integrated ATE Instrument for Characterization and High-Volume Production Test of Wireless Device Applications

Building on four generations of Teradyne wireless test solutions and over 30 years of RF test experience, Teradyne’s new UltraWave™ wireless test instrument delivers a flexible test solution for the most demanding RF requirements today with the performance headroom for testing the next generation of wireless devices. It spans the broadest range of complex RFIC and RFSoC wireless device applications, including:

•Wireless LAN                        •4G cellular
•Cellular                               •MIMO
•Bluetooth                             •WiMax
•Set-top box (STB)                •Ultrawideband

 


“The UltraWave test instrument fits our needs perfectly. Its wide-ranging capabilities and high port count of generic microwave IOs is an excellent combination of engineering productivity, performance, multi-site parallelism, and cost of test.”

- Kris Hublitz, Senior Director of Test Engineering, Broadcom
More about UltraWave