Test Products
Built from the ground up to provide revolutionary levels of test performance and multisite efficiency, the FLEX Test Architecture sets a new standard for test economics. With FLEX, you'll need fewer testers to achieve the ultra-high throughput levels demanded in today's competitive electronics market.
Recognized for its achievements in parallelism, precision and speed, FLEX delivers high-quality, high-efficiency multisite test across the widest range of device technologies-including digital, analog, DC, RF and memory. |
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With FLEX, test time is reduced to its theoretical minimum—the operational speed of the device under test. Several breakthrough technologies make this possible:
- Sync-Link™ keeps tests precisely synchronized across multiple independent time domains for greater test flexibility and repeatability. Instrument control is from the digital pattern on a vector-by-vector basis with direct setup through instrument microcodes for the fastest possible test times.
- Background DSP™ enables the analysis of test data while subsequent tests are run, with instrument-initiated data moves and dedicated processors.
- System Broadcast™ reduces overall instrument setup and settling time by programming all settings in parallel, in just one step.
- Site-aware instrumentation eliminates complex failure-condition programming.
- Universal Slot Test Head design allows highly flexible reconfigurations and future scalability. Instrument boards are interchangeable between test head slots, making it easy to adapt FLEX Family systems to changing production needs.
Other core architectural features that enable the FLEX Family to offer significant advantages over traditional test systems include:
IG-XL
| Simplifying program development—and speeding time to market | |
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