Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

 

Best In Test 2003

Teradyne's FLEX semiconductor test system received a 2003 Best in Test Award from Test & Measurement World magazine. Introduced in March 2002, FLEX has established a base of customers who selected the system for its configuration flexibility, architecture, and high-volume production efficiency.

Test & Measurement World’s Best in Test Awards honor new products that bring significant technological advances to the test industry. The technical editors review all nominations as well as all products covered in the magazine in the past year. Products are selected for the award based on technical merit and technical innovation.

"With FLEX, Teradyne has introduced a platform that will cost effectively address DC-to-microwave analog circuits as well as DFT-enabled logic circuits," said Rick Nelson, Test & Measurement World executive editor. “FLEX's reconfigurable universal-slot architecture appears to be well positioned to effectively deploy the clock and instrumentation resources necessary to test emerging mixed-signal system-on-chip devices."

 

FLEX combines test technology innovations to increase productivity for IC makers:

SOC "Tester-per-Device-Core" Architecture
 FLEX delivers a complete set of test resources - DC, AC, digital - to each device core with full synchronization and control of multiple time domains on a vector-by-vector basis.

High-Density Instrumentation

FLEX packs more high-performance capability onto each board and into each system. Each instrument has its own clock, sequencer, dynamic setup memory and parametric capability. Even DC instruments are pattern driven and synchronized to the device-under-test.

Universal Slots
FLEX’s universal slot tester-in-a-test-head design allows any mix of digital, DC, analog, power, and microwave resources. When device test needs change, FLEX is easily reconfigured to match the new test demands.

Multi-level IG-XL software
FLEX changes everything with multilevel IG-XL  software: template programming, device specific test procedures, and low-level instrument control – all at once.

 

Find out more about FLEX, the test system that was awarded "Best in Test" to see how FLEX can add to your test floor: