Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Achieving Device-Limited Test Throughput

The FLEX platform architecture is designed for the highest throughput possible by approaching device-limited testing – testing limited only by the operational speed of the device-under-test (DUT). The FLEX Sync-Link™ architecture and Background DSP™ processing enable that approach with the ability to:

  • Synchronize all digital, DC and AC instrumentation in device clock time on a vector-by-vector basis;
  • Separate the operation of those instruments into multiple device time domains;
  • Transparently process test data simultaneously with performing device tests.

The result is each device core being tested at its own clock speed, with its own instrument resources and its own test data processing, creating a "tester-per-device-core" architecture for the device-under-test.

Pure Parallel Multi-Site Test >

 

 

Sync-Link Architecture