Teradyne Semiconductor Test

Test Products

Contact Information

Support

Sales

Test Cell Products

Outsourcing Test

About Semiconductor Test

Advanced Search | Site Map

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Home > FLEX > Options: High Voltage Digital (HVD)

	High Voltage Digital (HVD) Option
Device Test Solutions for: .: Structural & Functional .: Digital .: High Power .: Low Power .: Power Management .: Cellular Baseband .: Wireless Baseband .: Video .: Audio .: Optical .: RF	The FLEX High Voltage Digital (HVD) option delivers a complete and economical test solution for digital communication interfaces on automotive/power semiconductor devices, such as ABS, Airbag, and Engine Controller Units (ECU). Typical automotive devices, like the highly integrated ABS and Airbag controllers, require a diverse set of test instrumentation ranging from high-voltage digital channels to VI and timing measurement. Traditional tester architectures limit the number of pins and sites tested in parallel for these types of devices. FLEX HVD delivers a full suite of instrumentation on a single board to test digital performance, high-voltage clamp, propagation delay, and rise- and fall-times through a single resource with 24 channels per HVD board. This enables parallel test of pins and sites, and cuts test times and equipment costs. The HVD instrument board has a unique feature set to achieve the best test economics. Each HVD board delivers 24 full-featured test channels and each channel provides: High-voltage digital pin electronics High-voltage PMU Quadruple event stamper Automated Hysteresis Test Flexible Output relay matrix The HVD option leverages the FLEX pattern generator micro code-controlled PSET programming environment, which ensures the HVD option is fully synchronized with all instruments on the FLEX test system. FLEX is the only test system providing this pattern generator capability which is essential for testing complex automotive semiconductor devices where synchronization between digital and analog instruments is mandatory to keep test times at a minimum. Click here to get more information about the FLEX High-Voltage Digital Option.