Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

High-Efficiency Multi-Site Test

Multi-site testing helps achieve optimum cost of test for analog, mixed signal, and digital devices. The FLEX Platform architecture enables you to easily implement multi-site test programs operating at high efficiency.

 

High-Density Instruments

 

The high-density test instrumentation packs more high-performance capability onto each board and into each system. With dedicated resources for each test site, you can completely replicate the device operating environment without sharing instruments. You can readily enable multi-site parallel test with up to 99% test efficiency. Adjustable site boundaries maximize parallelism that’s determined by device pin count, not the limits of the test architecture.

close up of DIB

 

System Broadcast™ Capability

System Broadcast™ capability uses a single test computer command to simultaneously set up instruments connected to each device site, reducing test overhead. One command controls multiple instruments at the same time, independent of site count, reducing overall set-up and settling time, and increasing test efficiency for multi-site testing.

 

IG-XL™ Software

The FLEX Platform's IG-XL™ software operating system organizes device-oriented data and test methods into a test flow that’s designed for multi-site test. IG-XL software provides streamlined test program development and debug with standard templates and code-level programming. Programmers can cut, paste, or intermix at any level.

Built-in multi-site support enables easy implementation of efficient parallel test. Test procedures are the same, no matter the number of sites. After writing the program for a single site, you can instantly expand it to mult-site test. Debug tools are even site aware to streamline final development for production.

Performance Scalability >