Test Products
The FLEX platform is architected for change and scalability. As device mix changes over time, system configurations can be changed to adapt to the needs of the test floor. Universal Slot test head design and instrument-sliced IG-XL operating software make it easy to add instruments, either to expand multi-site test capability or to test a different set of devices. And FLEX makes it easy to add the latest instrumentation for emerging test requirements to cover the broadest range of devices in the future.
Universal Slot Test Head
The Universal Slot test head design gives you the ability to reconfigure and scale the system over time. You can plug any instrument (digital, AC or DC) into any slot. Every slot has full access to Sync-Link synchronization and Background DSP processing.
Suite of High Performance Instrumentation
The FLEX Platform has a full complement of digital, DC, and AC high-density instrumentation, designed to address a broad range of device test requirements and enable multi-site production testing of complex SOC and SIP devices. You can easily configure a FLEX system to create the tester-per-device-core capability required for a particular device test operation.
OpenFLEX™ Open Architecture
Teradyne's OpenFLEX open architecture initiative leverages the open system architecture of the FLEX platform. It provides the commercial and technical infrastructure for developing and implementing customer and third-party instruments focused on specific capabilities and applications that complement the standard suite platform instrumentation.
The FLEX Platform's hardware and mechanical approach (with independent instrument timing, synchronized instrument operation, accessible Background DSP processing, and Universal Slot design) makes the development of additional instrumentation highly feasible. IG-XL software provides easy installation of new instrumentation, with full integration into the FLEX platform operating system.
