Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

UltraPin800 – Taking UltraFLEX Value to the Next Level

Teradyne’s UltraPin800 instrument doubles the available digital pin count of the UltraFLEX platform. allowing customers to achieve higher levels of device integration and lower cost of test. With its combination of speed and economics, UltraPin800 provides a far more attractive price/performance capability than competitive systems that require a mix of different digital instruments to deliver the same capability.

Lowering Cost of Test

UltraPin800’s increased pin count allows customers to increase the multisite capability of the UltraFLEX. The 128 digital pin instrument doubles the productivity of manufacturing floor space with a comparatively small increase in capital cost. It also takes advantage of the UltraFLEX’s core architectural features, including Sync-Link, System Broadcast and Pattern Oriented Programming, to achieve near-ideal multisite efficiency, providing an excellent return on both tester and handler capital investments. 

The UltraPin800 can also be licensed for different levels of speed, memory depth and functionality, allowing customers to tailor capital costs to actual test requirements.

 

 UltraPin800 Instrument Board

Enabling Higher Levels of Device Integration

With the advent single-chip cell phones, multicore processors and increasingly complex microcontrollers, digital content and pin count are increasing for all types of SOCs. By upgrading current UltraFLEX systems with the UltraPin800, customers can stay ahead of the complexity curve. The UltraPin800 is code- and pin-compatible with the existing HSD1000 option and can be installed alongside any existing UltraFLEX instrument. 

The UltraPin800 offers several new features to make test program and DIB development simpler for highly integrated devices, improving Time-to-Market.  Per-pin PMUs and programmable current loads reduce the need for resource sharing and also help reduce test time. To accommodate the increased integration of Non-Volatile Memory (NVM), the UltraPin800 offers pattern-controlled high voltage (Vihh) capability on every pin.

Future Test Coverage

In addition, unlike competitive offerings, the UltraPin800 can “future proof” UltraFLEX customers since it provides both high density and high speed, providing test coverage through the vast majority of DDR2 data rates. The UltraPin800 offers true differential capability on every pin pair.