Boundary Scan (IEEE standard 1149.1) is a technology that allows silicon manufacturers to design testability into the components that they manufacture. Teradyne has flexible boundary scan solutions that include native BasicSCAN and Scan Pathfinder products on the TestStation ICT platform. These Teradyne developed boundary scan solutions have been specifically designed to perform 1149.1 tests in the in-circuit test environment and are tightly integrated with the in-circuit test generators. They use available tester instrumentation hardware to apply the boundary scan test vectors and to increase overall test fault coverage (no additional hardware is required to execute the boundary scan tests).

BasicSCAN™ Test Generator

BasicSCAN is a Teradyne developed solution that automatically generates TestStation digital test models for boundary scan components. Given component boundary scan information, BasicSCAN can generate a comprehensive digital test model in seconds. The BasicSCAN test relies on using tester nails to detect opens on device pins, therefore it is designed for test situations where the tester has access to a majority of the device pins.

Scan Pathfinder ™

Scan Pathfinder is a Teradyne developed solution that is designed to automatically generate and execute comprehensive tests of boards that have IEEE 1149.1 compliant boundary scan components and limited tester access. Scan Pathfinder does not require tester nail access to detect targeted faults on the boundary scan nets; therefore it is primarily intended for test situations where the tester will not have access to the boundary scan device pins.

Partnership Boundary Scan Solutions

Teradyne offers support for popular stand-alone boundary scan solutions for manufacturers who want to integrate the boundary scan test solution of their choice with the TestStation in-circuit test system.

Symphony

Symphony is an advanced boundary scan solution designed in partnership with JTAG Technologies specifically for manufacturers using Teradyne’s TestStation in-circuit test systems. Read the press release here .

ScanExpress

Corelis ScanExpress is a popular JTAG test development and execution tool used to test for basic shorts/opens/bad/missing defects and to perform in-system programming of memory and CPLDs on circuit boards. Read the press release here.

SCANFLEX / CASCON GALAXY

GOEPEL electronic offers an integration option for the TestStation family of in-circuit testers utilizing specifically designed SCANFLEX devices in combination with the JTAG/Boundary scan system software CASCON GALAXY. Read the press release here .