TestStation™ and 228X™ board test systems have the ability to program and test Flash EEPROMS™. Using the Deep Serial Memory (DSM) option greatly improves the efficiency and significantly enhances the test system throughput. Programming a Flash EEPROM, at the same time that it is being tested, reduces the number of steps in the manufacturing process and simplifies the programming task. Two production steps are combined into one without increasing board handling and setup time.

The test system provides bed-of-nail access to all signals and can automatically disable any device as required.