The most comprehensive solution for vectorless test available. MultiScan tests for opens on SMT device leads, using simple, generic power-off analog measurements of pin characteristics. No device libraries or models are required. With MultiScan, test programs that deliver fault coverage of greater than 90% can be generated in less than a day—without any knowledge of the device’s functional data.

Diagnostics to the pin level shorten repair time. MultiScan provides comprehensive testing of every VLSI package type (including BGAs), cold solder joints, connectors, and reversed electrolytic capacitors using three vectorless techniques: DeltaScanTM analog junction test, FrameScan PlusTM capacitive coupling test, and CapScanTMcapacitor orientation test. Together they deliver the highest vectorless test fault coverage available today.

For vectorless testing, DeltaScan analog junction test is the most effective technique available. DeltaScan provides very high fault coverage, especially on large VLSI devices. Predictable fault coverage allows you to plan the optimum test strategy. No fixture overclamp hardware or device sensors are required, reducing costs and set-up time. DeltaScan can test all package types, including ball-grid arrays (BGAs). DeltaScan programs in seconds with no test vectors or additional device function data needed.

FrameScan Plus checks for opens on SMT connectors, sockets, and some RAM arrays. CapScan safely detects misoriented polarized capacitors before power is applied to the board.