Highest Quality In-Circuit Test
 Teradyne’s TestStation™ family of In-Circuit Test Systems provides high volume electronics manufacturers with reliable high-quality test for the latest PCB technologies. Configurable from 256 to 7680 test pins, the TestStation product family provides the highest-capacity in-circuit test solution on the market.
Featuring SafeTest protection technologies and a turnkey test programming environment, the TestStation systems allow direct transfer of test programs and fixtures from all 228X and TestStation in-circuit testers without extra costs or further program development.
Comprehensive Fault Detection
Unpowered test capabilities for TestStation systems include shorts, vectorless opens, and analog value testing. Powered-up test capabilities include digital device vector testing, reduced access boundary scan testing, high speed FLASH and ISP device programming, frequency and time event measurements, synchronized mixed signal device testing, and functional cluster testing. These tests can be automatically generated using Teradyne’s D2B CAD preparation software and automatic test generation software or manually created using a simple, but powerful test programming language.
Teradyne’s advanced test quality software analyzes the test program and generates reports to show overall test fault coverage and unreliable tests that require additional debug.
Accurate, Reliable, and Safe Electrical Test
The strength of TestStation in-circuit testers lies in their ability to perform accurate, reliable, and safe powered-up testing. Patented SafeTest technologies like per pin programmable logic levels, backdrive current, and backdrive duration thresholds ensure potentially harmful voltage and currents are not applied to the board during device testing (even if the board is defective).
Multi-level digital isolation software automatically isolates device outputs on any nets being driven. This minimizes backdrive conditions and prevents potentially harmful voltage spikes that can occur when backdriven outputs suddenly change logic state. The specialized digital controller quickly executes test vectors to minimize the duration of backdrive currents and reduce the opportunity for voltage spikes that can occur from on-board activities.
For technical information on the benefits of Teradyne's Backdrive Current Sensing capabilities, refer to this paper...
Exceptional Diagnostic Accuracy and Test Throughput
TestStation provides excellent diagnostic accuracy because the closed-loop, low-impedance driver remains accurate even under fault conditions. Additionally, the unique programmable backdrive measurement and control capabilities of the TestStation can detect faults such as faulty enable pins and marginal output transistors that can not be detected on other in-circuit testers.
Patented diagnostic algorithms like SoftProbe, BusBust, and Adaptive Patterns are designed to minimize unnecessary board repairs and eliminate false failure reports.
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For more information on specific TestStation Product models, refer to the following:
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