• What is FrameScan?
  
  
• What is FrameScan FX?
  
  
• What fixture hardware does FrameScan FX require?
  
  
• How do I order the Framescan hardware?
  
  
• What ICT tester models will support FrameScan FX?
  
  
• When will FrameScan FX be available?
  
  
• How much will Framescan FX cost?
  
  
• When should Opens Xpress be Used?
  
  
• How does FrameScan FX compare with FrameScan and Opens Xpress?
  
  
• How does Framescan FX compare with Agilent’s VTEP?
  
  
• Will my existing Opens Xpress and FrameScan tests be compatible?
  
  
• What are Teradyne’s other Vectorless Test Techniques?
  
  
• How do I create and Debug the Vectorless Test Techniques?

What is FrameScan?
Framescan is a vectorless test technique that was originally developed by Teradyne for detecting open pins on component packages and connectors. FrameScan uses a capacitive test technique that tests for open pins by applying an AC signal to a node on an un-powered printed circuit board and measuring the voltage that is coupled to a plate that is positioned in close proximity to the component package or connector that is being tested.

The FrameScan software automatically learns the voltages that are coupled to the capacitive plate for each pin and sets appropriate voltage thresholds. During production testing, any pins that fall below the minimum learned voltage thresholds are reported as open.

The Framescan technique was developed originally for Teradyne’s Z18XX and Spectrum in-circuit testers and is equivalent to Agilent’s TestJet vectorless test technique. GenRad implemented a capacitive opens technique on their GR228X and TestStation in-circuit testers called Opens Xpress. The difference between Opens Xpress and FrameScan is the fixture hardware that is used to make the measurements. Opens Xpress uses passive pickup plates with the raw signal fed from the capacitive plates to a combined buffer/multiplexer board. FrameScan and TestJet use active pickup plates, where each plate has a buffer amplifier mounted directly on it, with the amplified signal fed to the multiplexer board.

Since the Framescan technique provides better fault coverage of low measurement signals, and is less susceptible to noise that may occur in the test environment, Teradyne upgraded the GR228X/TestStation software in June of 2004 (version 5.8.0) to support both the Opens Xpress and FrameScan vectorless test techniques.

Framescan is usually quite effective at detecting open pins on most device packages and connectors, however some device packages are untestable with Framescan because they have internal ground planes that shield the AC signal or have very small lead frames that minimize the voltage that is coupled to the capacitive plate.

What is FrameScan FX?
In response to the smaller device packages and connector technologies that are being used on new board designs, Teradyne has significantly improved Framescan by developing advanced measurement hardware and improved software algorithms. The hardware improvement includes a new low noise amplifier that increases the front-end gain of the active probe to minimize the effects of noise components at other stages in the measurement circuit. The software improvement includes an automatic precision mode that increases the number of measurement samples for low measurement signals.

Teradyne is marketing these collective hardware and software improvements that extend the measurement capabilities of the FrameScan capacitive opens technique under the product name FrameScan FX.

What fixture hardware does FrameScan FX require?
FrameScan FX uses the same Selector board as FrameScan. The Selector board routes the signals from the opens probes on the fixture to the tester’s voltmeter. The Selector board requires three separate voltages to power-up (+5V and +/-15V). This means that to run FrameScan on TestStation systems, they must be configured with the Fixed Power Supply option.

FrameScan supports either the traditional opens active probe or the new low-noise FX probe with increased signal gain. Both probe types can be mixed in the same fixture allowing developers to easily switch to FX probes if they find that the fault coverage is insufficient when using the traditional probe to test a micro-BGA or small connector. Switching is as easy as replacing the standard probe with the FX probe and re-learning the voltage measurements for the part.

How do I order the Framescan hardware?
Most in-circuit fixture manufacturers keep a stock of FrameScan hardware components so that they can quickly satisfy customer requests. Teradyne also sells a FrameScan Fixture Kit (PN 047-530-00) that consists of the following elements that make it possible to install up to 64 sensors.

The kit includes:

• 1 ea. PCA, FrameScan Selector Board, PN 051-065-00
• 2 ea. HDR, 64 pin, double row, w/w, PN 359-489-64
• 1 ea. HDR, 10 pin, ribbon, w/w, PN 359-489-64
• 2 ea. CONN, 10 pin, ribbon, PN 063-079-00
• 24" CBL, 10 conductor ribbon, PN 084-34X-00

The FrameScan sensor parts available are:

• PCA, FrameScan Amp (with 2 probes; 10 assemblies) PN 047-531-00
• PCA, FrameScan .375" x .475",(kit of 10 assemblies) PN 090-360-00
• PCA, FrameScan .425" x .575", (kit of 10 assemblies) PN 090-361-00
• PCA, FrameScan .500" x 6.250", (kit of 1 assembly) PN 090-362-00
• PCA, FrameScan 1.25" x 1.25", (kit of 10 assemblies) PN 090-363-00
• PCA, FrameScan 2.56" x 2.56", (kit of 1 assembly) PN 090-364-00
• INSULATOR, Sheet 5.25" x 7.25" (kit of 10 sheets) PN 047-533-00

A kit of 10 FrameScan FX amplifiers can be ordered separately from Teradyne (P/N 093-284-00).

Refer to Appendix J of the Vectorless Test Techniques User’s Guide (PN 9007410908) for complete FrameScan assembly information and instructions.

What ICT tester models will support FrameScan FX?
Framescan FX was developed on software version 5.9.0 and Spectrum version 5.0 software. The new software algorithms were not added to the older software versions therefore it is NOT supported on the discontinued GR228X, TS8X, and Z18XX tester models.

Teradyne announced in 2004 that software release 5.8.0 would be the last software version that would support Combo based test systems. The UltraPin was introduced back in 2000 and shortly after Teradyne stopped selling Combo based systems.

Manufacturers with these older model testers must upgrade to the latest TestStation UltraPin or Spectrum testers before they can take full advantage of the FrameScan FX feature. Alternatively, these manufacturers can continue to use the original FrameScan, Opens Xpress, DeltaScan, and Junctions Xpress vectorless test techniques that remain available on these older tester models.

It is possible for customers with Combo based testers to experience some of the benefits of FX (they can use the low noise high gain FX amplifier in their fixtures), but they will not experience the full benefits because the precision FX algorithms are not available in the 5.8.0 software. This makes it possible to design a single fixture that will run on both Combo and UltraPin based systems. But, because of the software differences between the two systems, it will be necessary to learn and maintain two separate Pin Opens Data files (POD) for the two systems. And, since the 5.8.0 software does not contain the improved high accuracy mode algorithms that are only available in the 5.9.0 software, measurement readings will be lower and the overall pin fault coverage may be reduced when running on Combo based test systems.

If developers want to maintain a single POD file for both their Combo and UltraPin based testers, they can learn and create the POD file on their 5.8.0 software and then move it to their 5.9.0 UltraPin based tester. Doing this will maintain compatibility, but the developer will not gain the benefits of the higher performance FX software algorithms. POD files that are created on version 5.9.0 software cannot be moved back to Combo based systems running version 5.8.0 software (the software is forward compatible, but not backward compatible).

Finally, Teradyne offers attractive programs that allow customers to trade-in their Combo based test systems (at more than 3 times fair market value) for brand new UltraPin based test systems. Taking advantage of these programs will allow manufacturers to get all the benefits of the new Framescan FX and SafeTest technology and numerous software enhancements.

When will FrameScan FX be available?
A pre-release version of the FrameScan FX software was released to selected manufacturers in December of 2004 so that they could evaluate its capabilities and validate its production readiness.

FrameScan FX was officially released to all other manufacturers in Q2 of 2005. The software support was released as a patch to Spectrum 5.0 and as software version 5.9.0 on the TestStation

• If the TestStation UltraPin based tester has an active SSA contract, the FrameScan/Opens Xpress software license, and a Fixed Power Supply; then there will be no additional cost. As soon as the TestStation version 5.9.0 software is installed on the tester, FrameScan FX will be available.
• If the tester is not under an active SSA contract, then the manufacturer must purchase an SSA contract before they can install the version 5.9.0 software on their TestStation system. Software support contracts can be purchased from Teradyne for a cost of $3500USD per system.
• If the target TestStation system does not have the +5V/15V or +5V/12V Fixed User Power Supply option, then the manufacture must purchase and install one of these fixed supplies in their TestStation system before they can run FrameScan. The cost of the Fixed Power Supply is $2200USD.
• If the TestStation target tester is not licensed to run the FrameScan/Opens Xpress capacitive opens vectorless test technique, then it will not be able to run any FrameScan tests. The cost to purchase this software license is $10,000USD.

To encourage manufacturers that have older ICT tester models, Teradyne is offering generous trade-in programs that allow them to upgrade to the latest TestStation UltraPin test systems so that they can receive all the benefits of SafeTest and enhanced FrameScan FX technologies. Refer to Teradyne’s Assembly Test Division website or your local Sales representative for more information.

When should Opens Xpress be Used?
The Opens Xpress capacitive opens technique is available as an option on all GR228X and TestStation testers and still remains effective for most device packages and connector components. If manufacturers are developing programs and fixtures that need to run on older GR228X and TestStation non-UltraPin test systems, then Opens Xpress or the original FrameScan hardware should be used (because FrameScan FX is not supported on non-UltraPin test systems).

Since the FrameScan vectorless technique is capable of measuring smaller signals and is less susceptible to noise in the manufacturing environment, Teradyne recommends that FrameScan be used instead of Opens Xpress in most situations.

How does FrameScan FX compare with FrameScan and Opens Xpress?
Evaluations comparing the capabilities of Opens Xpress, FrameScan, and FrameScan FX were conducted in late 2004 and early 2005 by Teradyne and at leading OEM and EMS companies. Here is a list of the findings reported during these evaluations:

• The active probe plate used by the original FrameScan technique improved the Signal-to-Noise Ratio (SNR) by 9.5dB compared to the passive probe plate (no amplifier) approach that is employed by Opens Xpress
• The low impedance measurement path of the FrameScan hardware is less likely to be affected by noise sources in the Manufacturing environment (fluorescent lighting, other capital equipment, proximity of operator, etc.). Using a signal generator as a noise source and placing it close to the measurement probe proved this. The FrameScan S/N ratio was only slightly affected by the noise source (reduction of 2dbV: 43dbV to 41dbV) while the effect on the Opens Xpress S/N ratio was much greater (reduction of 46dbV: 50dbV to 4dbV)
• FrameScan measurements averaged 2-4 times higher than Opens Xpress measurements (some pins measured greater than 10 times higher with FrameScan)
• FrameScan FX measurements averaged 6-7 times higher than Opens Xpress measurements (some pins measured greater than 70 times higher with FrameScan FX). The comparison chart below shows the typical difference in measurement magnitudes between the three different techniques

• The opens pin fault coverage differences between the three techniques had small to large variations depending on the device packaging and lead frame sizes. The chart below shows that the FrameScan with FX probe vectorless opens test technique had the best pin fault coverage for all package types.

Capacitive Opens Fault Coverage Comparison

• The higher measurement signal and Signal-to-Noise ratio of the FrameScan with FX probe technique decreased the likelihood of false failure and false passes. The chart below shows the large difference in voltage potentials that were measured when open pin faults were intentionally injected on the board. FrameScan FX was able to correctly diagnose all the device pins that had open pin faults.

How does Framescan FX compare with Agilent’s VTEP?
Agilent’s literature indicates that their VTEP solution has an average S/N ratio improvement of 12dbV compared to their TestJet solution. Teradyne’s FrameScan FX solution provides a 17-18dbV improvement compared to TestJet. A 6db difference is equivalent to a 2:1 improvement in the S/N ratio. Therefore we calculate that the FrameScan FX solution will be equivalent or better than VTEP at detecting low measurement signal.

Early benchmarks conducted at two manufacturing facilities showed that VTEP and FrameScan FX were both able to obtain maximum pin fault coverage on challenging micro-BGAs and connectors.

Teradyne’s FrameScan solution is also more flexible and easier to implement because it works on existing test systems, can easily be added to existing test fixtures without re-wiring, and supports traditional as well as FX probes. In contrast, Agilent’s VTEP solution only works on testers with PC controllers, does not work with the standard TestJet hardware, and does not allow TestJet and VTEP probes to be mixed in the same fixture.

Will my existing Opens Xpress and FrameScan tests be compatible?
Existing test programs and fixtures that are using Opens Xpress will not be affected by the vectorless test improvements in the new FrameScan FX software release. These tests will continue to work and users do not have to re-learn their Opens Xpress data or create new POD files.

We recommend that existing Framescan tests be re-learned to create new measurement limits and POD files after you load the new software. Re-learning the FrameScan tests is fast and simple and can be accomplished in seconds using the Vectorless Test user interface.

What are Teradyne’s other Vectorless Test Techniques?
Teradyne also offers the following vectorless test techniques on their in-circuit test equipment.

• Junctions Xpress and DeltaScan – These techniques detect open pins on semiconductor devices by injecting a signal on a pin and measuring the affect of that signal at another pin on the device. These tests are fast and easy to implement since they do not require any special fixture hardware or wiring. They can only be used on devices that have semiconductor junctions and unlike the capacitive vectorless tests they do not work on connectors and sockets. These junction diode techniques are more susceptible to false failures because they require a reliable low impedance fixture connection, however they can be very effective at supplementing the coverage of pins that are not detected by other techniques.
• Orient Xpress – This is an extension of the Opens Xpress capacitive technique that detects when components are placed on the PCB with an incorrect orientation. FrameScan FX does not support the Orient Xpress technique because it requires an active guard instrument setup and FrameScan uses a fixed ground guard technique.
• Cap Xpress – This also is an extension of the Opens Xpress technique that is able to detect when polarized capacitors are mis-oriented on the PCB. FrameScan FX also supports the Cap Xpress feature.

How do I create and Debug the Vectorless Test Techniques?
Teradyne has made creation of the Vectorless tests simple and fast. At test generation time, the user simply selects which components they want to test with the vectorless test tools. The fixture generation software then creates a file that the fixture manufacturer can use to assemble the fixture with the appropriate vectorless test hardware.

During debug, the test developer uses a graphical user interface that can automatically learn the measurement values for the vectorless tests in seconds. The user interface also has options that allow the user to customize the tests and view the measurement values.

Shown below are screen shots of the new vectorless test user interface that was added to the TestStation software in release 5.8.0:

In summary, we believe that Teradyne in-circuit testers have the broadest and most capable vectorless test tools in the industry.