Memory Test Product Description

Full cell testing and programming of memory components generally requires many more test vectors than can be stored sequentially in the tester Driver/Sensor memory. Fortunately, the TestStation hardware and software supports a number of features to simplify testing of memory devices. A special Deep Serial Memory hardware option is capable of storing millions of test vectors and built-in data compression software features allows common test vectors to be stored in the same D/S pin memory locations.

Key Features

• Test library models for most common RAM, ROM, and FLASH memory components
• Automatic isolation of memory components using GenRad’s MLDI software feature
• Device memory tests automatically customized to the circuit wiring conditions
• Deep Serial Memory hardware option can store millions of unique test vectors
• Indirect addressing and Subroutine programming features allow compression of common test vectors
• Software Looping constructs for applying repetitive test vectors
• Built-in Cyclic Redundancy Check (CRC) measurement capabilities on all pins
• Automatic generation of Bank Tests for memory components that can be tested in parallel (reduces overall memory test time)